Title :
Multithresholding for arithmetic logic pattern matching
Author :
Lee, Chi Kwan ; Li, K.C.
fDate :
3/4/1993 12:00:00 AM
Abstract :
A new multithresholding scheme is presented to improve the peak score in a noisy environment for a 2D pattern searching system with multibit EXNOR proximity measure. This scheme combines the interclass thresholds and minimum noise error thresholds for robust recognition process.
Keywords :
automatic optical inspection; pattern recognition; 2D pattern searching system; AOI; arithmetic logic; industrial inspection; interclass thresholds; minimum noise error thresholds; multibit EXNOR proximity measure; multithresholding scheme; noisy environment; pattern matching; robust recognition process;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19930322
