DocumentCode
989277
Title
Elastic profile measurements of optical fibres via reflection acoustic microscopy
Author
Jen, C.K. ; Bussi¿¿re, J. ; Farnell, G.W. ; Kinsella, R.D.
Author_Institution
National Research Council of Canada, Industrial Materials Research Institute, Boucherville, Canada
Volume
19
Issue
22
fYear
1983
Firstpage
922
Lastpage
924
Abstract
The concentration of dopant materials which are responsible for the variation of the dielectric profile of the fused SiO2 host material for optical fibres also changes the elastic properties. This change has been observed by an acoustic microscope operated at 450 MHz. Acoustic micrographs of single-mode, multimode graded-index and multimode step-index optical fibres are given. This technique may be applicable to the study of fibre acoustic waveguides.
Keywords
acoustic microscopes; elasticity; optical fibres; 450 MHz; concentration of dopant materials; dielectric profile; elastic profile measurements; fibre acoustic waveguides; fused SiO2 host material; multimode graded index fibres; multimode step index fibres; optical fibres; reflection acoustic microscopy; single mode fibres;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19830630
Filename
4248165
Link To Document