DocumentCode
989343
Title
Zero-temperature-coefficient (ZTC) biasing of power VDMOS transistors
Author
Prijic, Zoran ; Pavlovic, Zoran ; Ristic, Sonja ; Stojadinovic, Ninoslav
Author_Institution
Nis Univ., Yugoslavia
Volume
29
Issue
5
fYear
1993
fDate
3/4/1993 12:00:00 AM
Firstpage
435
Lastpage
437
Abstract
It is shown that, in contrast to conventional MOSFETs power VDMOS transistors exhibit a unique ZTC point only in the saturation region of operation. Also, an analytical expression for the gate voltage for the ZTC biasing of power VDMOS transistors, leading to excellent agreement with experimental data, is derived.
Keywords
insulated gate field effect transistors; power transistors; 300 to 473 K; ZTC biasing; drain current; gate bias; gate voltage; high temperature operation; power VDMOS transistors; saturation region; transfer characteristics; zero temperature coefficient biasing;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19930291
Filename
250311
Link To Document