• DocumentCode
    990752
  • Title

    Low resistance and reflective Mg-doped indium oxide-Ag ohmic contacts for flip-chip light-emitting diodes

  • Author

    Song, June O. ; Leem, Dong-Seok ; Kwak, J.S. ; Nam, O.H. ; Park, Y. ; Seong, Tae-Yeon

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Gwangju Inst. of Sci. & Technol., South Korea
  • Volume
    16
  • Issue
    6
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    1450
  • Lastpage
    1452
  • Abstract
    We have investigated an Mg-doped InxOy(MIO)-Ag scheme for the formation of high-quality ohmic contacts to p-type GaN for flip-chip light-emitting diodes (LEDs). The as-deposited sample shows nonlinear current-voltage (I--V) characteristics. However, annealing the contacts at temperatures of 330°C-530°C for 1 min in air ambient results in linear I--V behaviors, producing specific contact resistances of 10-4--10-5 Ω·cm2. In addition, blue LEDs fabricated with the MIO-Ag contact layers give forward-bias voltages of 3.13-3.15 V at an injection current of 20 mA. It is further shown that LEDs made with the MIO-Ag contact layers give higher output power compared with that with the Ag contact layer. This result strongly indicates that the MIO-Ag can be a promising scheme for the realization of high brightness LEDs for solid-state lighting application.
  • Keywords
    III-V semiconductors; annealing; contact resistance; gallium compounds; indium compounds; light emitting diodes; magnesium; ohmic contacts; silver; 1 min; 20 mA; 3.13 to 3.15 V; 330 to 530 degC; GaN; InxOy:Mg-Ag; MIO-Ag contact layers; Mg-doped indium oxide-Ag contacts; annealing; contact resistances; flip-chip light-emitting diodes; high brightness LED; ohmic contacts; reflective contacts; Annealing; Brightness; Contact resistance; Gallium nitride; Indium; Light emitting diodes; Ohmic contacts; Power generation; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2004.827096
  • Filename
    1300628