Title :
Measurement of linewidth and FM-noise spectrum of 1.52 μm InGaAsP lasers
Author :
Kikuchi, Kazuro ; Okoshi, Tadashi ; Arata, R.
Author_Institution :
University of Tokyo, Department of Electronic Engineering, Tokyo, Japan
Abstract :
The linewidth of 1.52 μm InGaAsP lasers was measured as a function of the output power. The result shows that the linewidth is about 15 MHz when the output power is 1 mW. The FM-noise spectrum was also measured in the frequency range from 10 Hz to 100 MHz. The measured spectrum consists of the 1/f-noise and white-noise components. The linewidth calculated from the FM-noise spectrum is in good agreement with the measured value.
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; optical noise measurement; semiconductor junction lasers; spectral line breadth; 1/f-noise; FM-noise spectrum; III-V semiconductors; InGaAsP lasers; frequency range 10 Hz to 100 MHz; linewidth measurement; optical noise measurement; output power; semiconductor lasers; wavelength 1.52 micron; white-noise;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19840371
