DocumentCode :
992845
Title :
Pattern distortion due to edge diffractions
Author :
Balanis, Constantine
Author_Institution :
Langley Research Center, NASA, Hampton, VA, USA
Volume :
18
Issue :
4
fYear :
1970
fDate :
7/1/1970 12:00:00 AM
Firstpage :
561
Lastpage :
563
Abstract :
The method of combining wedge diffraction solutions for the analysis of an axial TEM-mode slot is extended here for an arbitrary aperture antenna in a finite size ground plane. The new approach, however, considers superposition of boundary-value and wedge-diffraction solutions on the same antenna. The boundary-value solution (primary pattern) considers the pattern component when the aperture is in an infinite ground plane, and the diffraction solution (secondary pattern) considers the contribution to the pattern from the edges of the finite ground plane.
Keywords :
Antenna terrain factors; Aperture antennas; Aperture antennas; Diffraction; Electrooptical waveguides; Electrostatic precipitators; Erbium; Integral equations; Planar waveguides; Rectangular waveguides; Slot antennas; Transforms;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.1970.1139737
Filename :
1139737
Link To Document :
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