• DocumentCode
    993107
  • Title

    Electromagnetic reconstruction of 2-D permittivity profiles of inhomogeneous dielectric cylinder by the diffraction slice-projection algorithm

  • Author

    Suh, Kyoung-Whoan ; Se-Yun Kim ; Ra, Jung-Woong

  • Author_Institution
    Samsung Electronics, Seoul, South Korea
  • Volume
    29
  • Issue
    2
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    1799
  • Lastpage
    1802
  • Abstract
    The diffraction slice-projection theorem is developed and implemented numerically for microwave imaging of two-dimensional dielectric objects. While the convolution-backprojection algorithm is used, the projection direction of the presented theorem is normal to the wavelength vector. Based on this algorithm, computer simulations provide fairly good images of weak inhomogeneities. For strong inhomogeneities, the physical mechanism on the degradation of images is explained by the fact that the distribution of the projection function leaks out its real extent along the range direction. Hence, the compression of the projection function is expected to be an effective tool for reconstructing strong inhomogeneous objects even if the necessary condition on the first-order Born approximation is violated
  • Keywords
    digital simulation; electromagnetic wave diffraction; image reconstruction; microwave imaging; permittivity measurement; 2D permittivity profiles; computer simulations; convolution-backprojection algorithm; diffraction slice-projection theorem; electromagnetic reconstruction; first-order Born approximation; inhomogeneous dielectric cylinder; microwave imaging; monostatic antenna; numerical method; projection function distribution; two-dimensional dielectric objects; wave propagation; wavelength vector; Approximation methods; Computer simulation; Degradation; Dielectrics; Electromagnetic diffraction; Image coding; Image reconstruction; Microwave imaging; Permittivity; Scattering;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.250755
  • Filename
    250755