DocumentCode :
994027
Title :
Special Feature: Fault Diagnosis of Microprocessor Systems
Author :
Srini, Vason P.
Author_Institution :
Virginia Polytechnic Institute and State University
Volume :
10
Issue :
1
fYear :
1977
Firstpage :
60
Lastpage :
65
Abstract :
The rapid growth in numbers of microprocessor-based intelligent terminals—e.g., POS terminals, communication preprocessors, and I/O processors for large computer systems—has brought with it increased awareness of the importance of guaranteeing the correct operation of the microprocessor without disturbing the use of the system. This in turn has focused attention on fault detection, location, and repair in such systems.
Keywords :
Automatic testing; Communication system control; Control systems; Fault detection; Fault diagnosis; Logic testing; Microprocessors; Random access memory; Read-write memory; System testing;
fLanguage :
English
Journal_Title :
Computer
Publisher :
ieee
ISSN :
0018-9162
Type :
jour
DOI :
10.1109/C-M.1977.217500
Filename :
1646233
Link To Document :
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