DocumentCode

994189

Title

Properties of NbN/Pb Josephson tunnel junctions

Author

van Dover, R.B. ; Bacon, D.D.

Author_Institution

Bell Laboratories, Murray Hill, New Jersey

Volume

19

Issue

3

fYear

1983

fDate

5/1/1983 12:00:00 AM

Firstpage

951

Lastpage

953

Keywords

Josephson device logic circuits; Circuits; Cleaning; Electrodes; Ion beams; Niobium; Oxidation; Resists; Sputtering; Substrates; Temperature;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.1983.1062388

Filename

1062388