Title :
Chaos in Josephson circuits
Author_Institution :
National Bureau of Standards, Boulder, CO
fDate :
5/1/1983 12:00:00 AM
Abstract :
Chaotic behavior in Josephson circuits is reviewed using the rf-driven junction as an example. Topics include the effect of chaos on the IV characteristic, the period doubling route to chaos, and power spectra for the chaotic state. Liapunov exponents and the fractal geometry of strange attractors are also discussed.
Keywords :
Chaos; Josephson devices; Chaos; Circuit noise; Circuit simulation; Fractals; Geometry; Josephson junctions; Metrology; Noise measurement; Nonlinear equations; Nonlinear systems;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1983.1062390
