DocumentCode
994333
Title
Semiconductor device simulation: the hydrodynamic model
Author
Gardner, Carl L.
Author_Institution
Arizona State Univ., AZ, USA
Volume
22
Issue
5
fYear
2004
Firstpage
17
Lastpage
19
Abstract
VLSI (very large scale integrated) chips incorporate hundreds of millions of semiconductor circuits. To predict the performance of VLSI circuits, the current-voltage (I-V) characteristics of the semiconductor devices are required. Semiconductor device simulation codes provide a way of predicting I-V curves as device parameters are varied, without having to fabricate the device first. Thus, many different designs for devices and circuits can be explored efficiently using computer simulations. Promising designs then can be selected for actual fabrication and testing. A fundamental approach to modeling the quantum transport of electrons and holes in semiconductor devices is the Wigner-Boltzmann equation, the quantum generalization of the Boltzmann equation. Simulating these kinetic equations is computationally expensive. Thus, a hydrodynamic approximation to the kinetic equations, where the density, velocity and temperature of a charge carrier are functions only of three spatial dimensions plus time, offers enormous computational speedups in simulating devices. The article discusses the use of classical and quantum hydrodynamic models in semiconductor device simulation.
Keywords
VLSI; digital simulation; electronic engineering computing; hydrodynamic model (elementary particles); semiconductor device models; VLSI; Wigner-Boltzmann equation; charge carrier; current-voltage characteristics; hydrodynamic model; kinetic equations; quantum transport; semiconductor device simulation; Circuit simulation; Computational modeling; Computer simulation; Equations; Fabrication; Hydrodynamics; Kinetic theory; Predictive models; Semiconductor devices; Very large scale integration;
fLanguage
English
Journal_Title
Potentials, IEEE
Publisher
ieee
ISSN
0278-6648
Type
jour
DOI
10.1109/MP.2004.1301241
Filename
1301241
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