• DocumentCode
    994572
  • Title

    The Effect of Transient Voltages on Dielectrics-IV Law of Impulse Spark-over and Time Lag

  • Author

    Peek, F.W., Jr.

  • Author_Institution
    Consulting Engineer, General Electric Company, Pittsfield, Massachusetts.
  • Volume
    49
  • Issue
    4
  • fYear
    1930
  • Firstpage
    1456
  • Lastpage
    1469
  • Abstract
    The law of time lag and impulse breakdown is derived from experimental data. This law, which appears to be rational, shows that a given amount of energy is required to cause. breakdown of a given gap and that voltage and time are interdependent. It is quite in accord with the work in the original paper and applies to breakdown on rectangular waves, on the front of slanting waves, or to overvoltages on standard waves.1 By means of simple formulas the results for any wave can be calculated or the effects of different waves correlated. Three general types of impulse tests, dependent on the form of wave used and the spark-over point selected, are discussed as follows: 1. The so-called "rectangular" wave with spark-over on the top 2. The uniformly rising voltage with spark-over on fronts of various slopes 3. The use of a "standard" wave of logarithmic front and tail with spark-over occurring at any desired point on it. Method 3, using the full standard wave, is by far the simplest to apply and gives the most consistent results. It is also shown that it may be used in a way to give effects equivalent to the other two methods. Interesting energy relationships for impulse failures of gaps are brought out in this connection. Field experience with actual lightning waves is compared to laboratory results with the "standard" wave and found to check very closely.
  • Keywords
    Breakdown voltage; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Impulse testing; Laboratories; Lightning; Power generation economics; Surges; Tail;
  • fLanguage
    English
  • Journal_Title
    American Institute of Electrical Engineers, Transactions of the
  • Publisher
    ieee
  • ISSN
    0096-3860
  • Type

    jour

  • DOI
    10.1109/T-AIEE.1930.5055687
  • Filename
    5055687