DocumentCode :
994584
Title :
Microstructure and Exchange Coupling of Segregated Oxide Perpendicular Recording Media
Author :
Nolan, Thomas P. ; Risner, Juliet D. ; Harkness, Samuel D., IV ; Girt, Erol ; Wu, Stella Z. ; Ju, Ganping ; Sinclair, Robert
Author_Institution :
Seagate Technol., Fremont, CA
Volume :
43
Issue :
2
fYear :
2007
Firstpage :
639
Lastpage :
644
Abstract :
The magnetic properties and corresponding microstructure of (Co 80Pt20)x (metal oxide)1-x perpendicular recording media have been studied as a function of the volume percentage (vol%) of metal oxide sputtering into the magnetic film. The exchange coupling field (Hex) estimated from the coercivity (H c) and nucleation field (Hn) decreases rapidly between 0-20 vol% of metal oxide. The analytical transmission electron microscope composition analysis of (Co80Pt20)x(TiO2)1-x media confirms that the microstructure includes crystalline grain cores in an apparently amorphous oxide matrix. The grain cores comprise only Co and Pt in a nearly constant ratio independent of the vol% of oxide addition. The amorphous matrix contains Co, Ti, and O, but no Pt. The Co concentration is nearly constant in grain boundary and core regions, unlike high-temperature longitudinal recording media wherein Co segregates to form a concentration gradient in the grain core. Perpendicular media thus maintain fairly high anisotropy of the grain core phase, even for very high-oxide concentrations that significantly decrease remanant magnetization (Mrt), Hc, and thermal stability (KuV/kT)
Keywords :
cobalt compounds; coercive force; grain size; magnetic thin films; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum compounds; sputtering; transmission electron microscopes; (Co80Pt20)x(TiO2) 1-x; amorphous oxide matrix; coercivity; concentration gradient; crystalline grain cores; exchange coupling; exchange coupling field; high-oxide concentrations; magnetic film; magnetic properties; metal oxide sputtering; microstructure; nucleation field; remanant magnetization; segregated oxide perpendicular recording media; thermal stability; Amorphous materials; Grain boundaries; Magnetic analysis; Magnetic cores; Magnetic films; Magnetic properties; Microstructure; Pareto analysis; Perpendicular magnetic recording; Sputtering; Electron microscopy; magnetic films; perpendicular magnetic recording;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2006.888208
Filename :
4069052
Link To Document :
بازگشت