DocumentCode :
994746
Title :
Integrated physics-oriented statistical modeling, simulation, and optimization [MESFETs]
Author :
Bandler, John W. ; Biernacki, Radoslaw M. ; Cai, Qian ; Chen, Shao Hua ; Ye, Shen ; Zhang, Qi-Jun
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
Volume :
40
Issue :
7
fYear :
1992
fDate :
7/1/1992 12:00:00 AM
Firstpage :
1374
Lastpage :
1400
Abstract :
Physics-based modeling of MESFETs is addressed from the point of view of efficient simulation, accurate behavior prediction and robust parameter extraction. A novel integration of a large-signal physics-based model into the harmonic balance equations for simulation of nonlinear circuits, involving an efficient Newton update, is presented and exploited in a gradient-based FAST (feasible adjoint sensitivity technique) circuit optimization technique. For yield-driven MMIC design a relevant physics-based statistical modeling methodology is presented. Quadratic approximation of responses and gradients suitable for yield optimization is discussed. The authors verify their theoretical contributions and exemplify their computational results using built-in and user-programmable modeling capabilities of the CAE systems OSA90/hope and HarPE. Results of device modeling using a field-theoretic nonlinear device simulator are reported
Keywords :
MMIC; Schottky gate field effect transistors; digital simulation; electronic engineering computing; equivalent circuits; optimisation; semiconductor device models; sensitivity analysis; solid-state microwave devices; statistical analysis; CAE systems; HarPE; MESFETs; Newton update; OSA90/hope; behavior prediction; circuit optimization technique; feasible adjoint sensitivity technique; gradient-based FAST; harmonic balance equations; large-signal physics-based model; nonlinear circuits; nonlinear device simulator; optimization; parameter extraction; physics-oriented statistical modeling; simulation; yield optimization; yield-driven MMIC design; Circuit optimization; Circuit simulation; Computer aided engineering; MESFETs; MMICs; Nonlinear circuits; Nonlinear equations; Parameter extraction; Predictive models; Robustness;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.146320
Filename :
146320
Link To Document :
بازگشت