Long-term aging of oscillators

Author

Filler, Raymond L. ; Vig, John R.

Author_Institution

US Army Res. Lab., Fort Monmouth, NJ, USA

Volume

40

Issue

4

fYear

1993

fDate

7/1/1993 12:00:00 AM

Firstpage

387

Lastpage

394

Abstract

The authors report aging results for more than 40 oscillators, from a variety of sources, for periods ranging from 1 yr to more than 10 yr. The aging data were accumulated with an automated aging facility. The oscillators that have been tested include temperature-compensated crystal oscillators (TCXOs) and oven-controlled crystal oscillators (OCXOs). The TCXOs were maintained in a controlled temperature environment. Several of the TCXOs were built for a gun-launched sensor application and have been shown to be capable of surviving more than 30000-g shock levels of 12-ms duration. The aging results for these ruggedized TXCOs are surprisingly good (<2*10/sup -10//d). The better OCXOs exhibit long term aging of a few parts in 10/sup 12//d.<>

Keywords

ageing; crystal resonators; environmental testing; life testing; military equipment; radiofrequency oscillators; 1 to 10 yr; automated aging facility; gun-launched sensor application; long term aging; military equipment; oven-controlled crystal oscillators; temperature-compensated crystal oscillators; Aging; Automatic control; Electric shock; Frequency; Oscillators; Performance evaluation; Prototypes; Temperature control; Temperature sensors; Testing;

fLanguage

English

Journal_Title

Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on

Publisher

ieee

ISSN

0885-3010

Type

jour

DOI

10.1109/58.251287

Filename

251287