• DocumentCode
    995295
  • Title

    Characteristics of Ti-indiffused waveguides in MgO-doped LiNbO3

  • Author

    Bulmer, C.H.

  • Author_Institution
    Naval Research Laboratory, Washington, USA
  • Volume
    20
  • Issue
    22
  • fYear
    1984
  • Firstpage
    902
  • Lastpage
    904
  • Abstract
    Diffusion parameters are determined from prism coupler measurements on optical waveguides formed by Ti diffusion in LiNbO3 doped with 5% MgO. The diffusion coefficient is 3¿4 times smaller than for similar waveguides in undoped LiNbO3. The Ti depth profile is shown to be Gaussian by SIMS analysis.
  • Keywords
    diffusion in solids; doping profiles; lithium compounds; magnesium compounds; optical waveguides; secondary ion mass spectra; titanium; LiNbO3:MgO waveguides; SIMS analysis; Ti depth profile; Ti diffusion; diffusion coefficient; optical waveguides; prism coupler measurements;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19840613
  • Filename
    4249125
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=995295