DocumentCode :
996033
Title :
Fast capacitance extraction of general three-dimensional structures
Author :
Nabors, Keith ; Kim, Songmin ; White, Jacob
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Volume :
40
Issue :
7
fYear :
1992
fDate :
7/1/1992 12:00:00 AM
Firstpage :
1496
Lastpage :
1506
Abstract :
K. Nabors and J. White (1991) presented a boundary-element-based algorithm for computing the capacitance of three-dimensional m-conductor structures whose computational complexity grows nearly as mn, where n is the number of elements used to discretize the conductor surfaces. In that algorithm, a generalized conjugate residual iterative technique is used to solve the n×n linear system arising from the discretization, and a multipole algorithm is used to compute the iterates. Several improvements to that algorithm are described which make the approach applicable and computationally efficient for almost any geometry of conductors in a homogeneous dielectric. Results using these techniques in a program which computes the capacitance of general 3D structures are presented to demonstrate that the new algorithm is nearly as accurate as the more standard direct factorization approach, and is more than two orders of magnitude faster for large examples
Keywords :
boundary-elements methods; capacitance; computational complexity; electronic engineering computing; iterative methods; packaging; IC packaging; boundary-element-based algorithm; computational complexity; conjugate residual iterative technique; fast capacitance extraction; homogeneous dielectric; multiconductor structures; multipole algorithm; three-dimensional structures; Acceleration; Capacitance; Computational complexity; Computational geometry; Conductors; Dielectrics; Electrostatics; Iterative algorithms; Jacobian matrices; Linear systems;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.146331
Filename :
146331
Link To Document :
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