Experimentally Measured Input Referred Voltage Offsets and Kickback Noise in RHBD Analog Comparator Arrays

Author

Hindman, Nathan D. ; Wang, Ziyan ; Clark, Lawrence T. ; Allee, David R.

Author_Institution

Arizona State Univ., Tempe

Volume

54

Issue

6

fYear

2007

Firstpage

2073

Lastpage

2079

Abstract

Analog comparator arrays fabricated on a bulk CMOS 130-nm are measured to quantify input-referred offsets due to transistor variation and kickback noise. Comparators using RHBD edgeless and conventional two-edge transistors are compared to determine the impact on the circuit behavior. Both random variation and kickback noise are slightly larger than for an equivalent design using two-edge transistors. The input-referred offsets are shown to be completely systematic.

Keywords

CMOS integrated circuits; analogue integrated circuits; analogue-digital conversion; comparators (circuits); integrated circuit noise; radiation hardening (electronics); CMOS; RHBD analog comparator arrays; analog-to-digital converters; input referred voltage offsets; integrated circuit radiation effects; kickback noise; radiation hardening; size 130 nm; transistor variation; two-edge transistors; Analog integrated circuits; Analog-digital conversion; Circuit noise; Integrated circuit noise; Ionizing radiation; Noise measurement; Parasitic capacitance; Power transmission lines; Radiation hardening; Voltage measurement; Analog comparator offset; analog-to-digital converters; integrated circuit radiation effects; kickback noise; radiation hardening;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2007.908654

Filename

4395036