• DocumentCode
    996594
  • Title

    A Design Language Based Approach to Test Sequence Generation

  • Author

    Hill, Fredrick J. ; Huey, Ben

  • Author_Institution
    University of Arizona
  • Volume
    10
  • Issue
    6
  • fYear
    1977
  • fDate
    6/1/1977 12:00:00 AM
  • Firstpage
    28
  • Lastpage
    33
  • Abstract
    There are two important advantages inherent in test sequence generation based on a design language description:
  • Keywords
    Analytical models; Circuit faults; Circuit testing; Information analysis; Iterative methods; Logic testing; Sequential analysis; Sequential circuits; System testing;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/C-M.1977.217743
  • Filename
    1646518
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=996594