Title :
Variance of simulated 1/f noise
Author_Institution :
Technical University, Department of Electronics Technology, Budapest, Hungary
Abstract :
A recently introduced mathematical model supporting the observed high variance of variance of excess noise is extended to a process having a 1/f spectrum. The variance of variance found by simulation was even higher than that of a Gauss-Poisson square wave.
Keywords :
random noise; flicker noise; mathematical model; simulated 1/f noise; variance;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19770162
