• DocumentCode
    997331
  • Title

    Measured surface spectrum dependence of backscattering from rough surface

  • Author

    Rouse, John W., Jr. ; Moore, RICHARD K.

  • Author_Institution
    Texas A&M Univ., College Station, TX USA
  • Volume
    20
  • Issue
    2
  • fYear
    1972
  • fDate
    3/1/1972 12:00:00 AM
  • Firstpage
    211
  • Lastpage
    214
  • Abstract
    The wavelength dependence of backscatter from a smoothly undulating randomly rough surface was measured over a broad continuous range of wavelengths using acoustic waves in water. The experiment resulted in discovering a transition region in which the wavelength dependence changed abruptly from \\lambda ^{0} to \\lambda ^{+3} , apparently due to change in the surface height spectrum. The wavelength dependence corresponded to the measured surface height spectrum through the transition region in the manner predicted by the composite surface model formulated by Wright and others. A similar spectrum-dependent effect has been found in broad-spectrum electromagnetic measurements of natural surfaces.
  • Keywords
    Acoustic scattering; Electromagnetic (EM) scattering by rough surfaces; Rough surfaces; Sea surface; Acoustic measurements; Acoustic waves; Backscatter; Electromagnetic measurements; Predictive models; Rough surfaces; Surface acoustic waves; Surface roughness; Surface waves; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.1972.1140170
  • Filename
    1140170