• DocumentCode
    997336
  • Title

    Integrated CMOS transmit-receive switch using LC-tuned substrate bias for 2.4-GHz and 5.2-GHz applications

  • Author

    Talwalkar, Niranjan A. ; Yue, C. Patrick ; Gan, Haitao ; Wong, S. Simon

  • Author_Institution
    IRF Semicond. USA, Cupertino, CA, USA
  • Volume
    39
  • Issue
    6
  • fYear
    2004
  • fDate
    6/1/2004 12:00:00 AM
  • Firstpage
    863
  • Lastpage
    870
  • Abstract
    CMOS transmit-receive (T/R) switches have been integrated in a 0.18-μm standard CMOS technology for wireless applications at 2.4 and 5.2 GHz. This switch design achieves low loss and high linearity by increasing the substrate impedance of a MOSFET at the frequency of operation using a properly tuned LC tank. The switch design is asymmetric to accommodate the different linearity and isolation requirements in the transmit and receive modes. In the transmit mode, the switch exhibits 1.5-dB insertion loss, 28-dBm power, 1-dB compression point (P1dB), and 30-dB isolation, at 2.4 and 5.2 GHz. In the receive mode, the switch achieves 1.6-dB insertion loss, 11.5-dBm P1dB, and 15-dB isolation, at 2.4 and 5.2 GHz. The linearity obtained in the transmit mode is the highest reported to date in a standard CMOS process. The switch passes the 4-kV Human Body Model electrostatic discharge test. These results show that the switch design is suitable for narrow-band applications requiring a moderate-high transmitter power level (<1 W).
  • Keywords
    CMOS integrated circuits; MOSFET; field effect transistor switches; microwave integrated circuits; microwave switches; 1.5 dB; 2.4 GHz; 5.2 GHz; CMOS integrated circuits; CMOS process; CMOS technology; CMOS transmit-receive switch; LC tank; LC-tuned substrate bias; MOSFET switches; RF CMOS switch; T/R switch; electrostatic discharge test; human body model; insertion loss; microwave switches; moderate-high transmitter power level; narrow-band applications; receive modes; substrate impedance; transmit modes; wireless applications; CMOS process; CMOS technology; Frequency; Impedance; Insertion loss; Isolation technology; Linearity; MOSFET circuits; Propagation losses; Switches; CMOS integrated circuits; MOSFET switches; RF CMOS switch; T/R switch; microwave switches;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2004.827809
  • Filename
    1302263