Author :
Van Doren, Tom ; Hubing, Todd ; Sha, Fei ; Drewniak, James ; Hockanson, David
Author_Institution :
Dept. of Electr. Eng., Missouri Univ., Rolla, MO, USA
Abstract :
The authors discuss electromagnetic compatibility (EMC) and electromagnetic interference (EMI). After a brief look at the causes of EMI, they describe conductive coupling and electromagnetic radiative coupling. Career opportunities in EMC problem solving are looked at
Keywords :
electromagnetic compatibility; electromagnetic interference; career opportunities; conductive coupling; electromagnetic compatibility; electromagnetic interference; electromagnetic radiative coupling; noise; Acoustic noise; Aerospace electronics; Aircraft; Cables; Circuits; Communication system control; Electromagnetic compatibility; Electromagnetic interference; Frequency; Home appliances;
Journal_Title :
Potentials, IEEE
