A time-resolved optical system for spatial characterization of the carrier distribution in a gate turn-off thyristor (GTO)

Author

Bleichner, Henry ; Nordlander, Edvard ; Rosling, Mats ; Berg, Soren

Author_Institution

Inst. of Technol., Uppsala Univ., Sweden

Volume

39

Issue

3

fYear

1990

fDate

6/1/1990 12:00:00 AM

Firstpage

473

Lastpage

478

Abstract

The measurement of two-dimensional (2-D) excess-carrier distribution in a gate GTO by a time-resolved infrared-absorption technique is discussed. The optical scanning system employs a wide memory digital oscilloscope for data acquisition and a computer system for control, data processing, and display. Maps of the carrier distribution in the active GTO device are produced under steady-state conditions as well as during turn-on and turn-off operation. The maps are presented as three-dimensional (3-D) views produced from 2-D measurements

Keywords

carrier density; computerised instrumentation; data acquisition; digital instrumentation; electrical conductivity measurement; high-speed optical techniques; thyristors; 2D excess carrier distribution; 3D; He-Ne laser; IR absorption; carrier distribution; data acquisition; gate turn-off thyristor; optical scanning system; steady-state conditions; time-resolved optical system; turn-on; wide memory digital oscilloscope; Computer displays; Control systems; Data acquisition; Data processing; Optical computing; Optical control; Oscilloscopes; Process control; Steady-state; Two dimensional displays;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.106275

Filename

106275