DocumentCode :
998296
Title :
1984 Academic Forum for Test Technology October 19, 1984
Volume :
2
Issue :
3
fYear :
1985
fDate :
6/1/1985 12:00:00 AM
Firstpage :
86
Lastpage :
86
Abstract :
Provides notice of upcoming conference events of interest to practitioners and researchers.
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1985.294745
Filename :
4069593
Link To Document :
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