Title :
Reliability of CMOS Integrated Circuits
Author :
Schnable, G.L. ; Gallace, L.J. ; Pujol, H.L.
Author_Institution :
RCA Laboratories
Abstract :
CMOS ICsare being produced using a variety of processes, and considerable data is now available on their reliability and failure mechanisms.
Keywords :
CMOS digital integrated circuits; CMOS integrated circuits; CMOS technology; Digital integrated circuits; Integrated circuit reliability; Integrated circuit technology; MOS devices; Packaging; Substrates; Voltage control;
DOI :
10.1109/C-M.1978.217937
