The Test Engineer´s Assistant: a support environment for hardware design for testability

Author

Hallenbeck, Jill J. ; Cybrynski, James R. ; Kanopoulos, Nick ; Markas, Tassos ; Vasanthavada, Nagesh

Author_Institution

Center for Digital Syst. Res., Research Triangle Park, NC, USA

Volume

22

Issue

4

fYear

1989

fDate

4/1/1989 12:00:00 AM

Firstpage

59

Lastpage

68

Abstract

A description is given of TEA (Test Engineer´s Assistant), a CAD (computer-aided design) environment developed to provide the knowledge base and tools needed by a system designer for incorporating testability features into a design. TEA helps the designer meet the requirements of fault coverage and ambiguity group size. Fault coverage is defined as the percentage of faults that can be detected out of the population of all faults of a unit under test with a particular test set. An ambiguity group is defined as the smallest hardware entity in a given level of the system design hierarchy (that is, board, subsystem, and system) to which a fault can be isolated. The fault model considered throughout is the single stuck-at fault model. An example application of TEA is included.<>

Keywords

circuit CAD; computer architecture; logic testing; CAD; TEA; Test Engineer´s Assistant; ambiguity group size; computer-aided design; fault coverage; hardware design; knowledge base; smallest hardware entity; support environment; system designer; testability; Automatic testing; Costs; Design automation; Design engineering; Design for testability; Hardware; Performance evaluation; Process design; Software testing; System testing;

fLanguage

English

Journal_Title

Computer

Publisher

ieee

ISSN

0018-9162

Type

jour

DOI

10.1109/2.25383

Filename

25383