Title :
Accuracy of numerical solution of temperature distribution in semiconductor devices under dynamic conditions
Author_Institution :
Polytechnic of Lód¿, Institut of Elektronics, Faculty of Electrical Engineering, Lód¿, Poland
Abstract :
The temperature distribution in semiconductors is usually calculated by means of the indirect Liebmann´s method since its absolute stability permits the choice of relatively long time and space steps. It is shown that under dynamic conditions this method is no longer better because of the requirement of a given accuracy. A method of improving the accuracy without undesired increase of the number of division points has been proposed.
Keywords :
numerical methods; semiconductor devices; temperature distribution; thyristors; dynamic conditions; heat transfer equation; numerical solution accuracy; semiconductor devices; temperature distribution; thyristor turn on process;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19780372
