DocumentCode
999685
Title
Electrostatics of partially gated carbon nanotube FETs
Author
Clifford, Jason P. ; John, D.L. ; Castro, Leonardo C. ; Pulfrey, D.L.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
Volume
3
Issue
2
fYear
2004
fDate
6/1/2004 12:00:00 AM
Firstpage
281
Lastpage
286
Abstract
The finite-element method is used to solve Poisson´s equation, under equilibrium conditions, for coaxial carbon nanotube field-effect transistors in which the gate electrode does not entirely cover the nanotube channel between the source- and drain-end contacts. A conformal transformation is applied to overcome the problems that arise in this open structure of specifying boundary conditions and of terminating the model space. The effect on the potential distribution within the transistor of changing various geometrical properties of the device is investigated, and some special conditions under which appropriate boundary conditions may be defined a priori are identified. The effects on the potential energy profile along the nanotube of varying the work function of the end contacts, and of introducing charge into the gate dielectric, are also investigated. The latter is shown to be effective in suppressing the otherwise dominant role that the end contacts play in determining the barrier to charge flow in the nanotube, thereby allowing bulk control to occur.
Keywords
Poisson equation; carbon nanotubes; electrostatic devices; field effect transistors; finite element analysis; nanotube devices; semiconductor device models; C; FET; Poisson equation; boundary conditions; carbon nanotube field-effect transistors; charge flow; drain end contacts; finite-element method; gate dielectric; gate electrode; gated carbon nanotube; geometrical properties; nanotube channel; potential energy profile; source end contacts; Boundary conditions; CNTFETs; Coaxial components; Contacts; Electrodes; Electrostatic analysis; FETs; Geometry; Nanoscale devices; Tunneling; Carbon nanotube transistors; FETs; electrostatic analysis; field-effect transistors; nanotechnology; semiconductor device modeling;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2004.828539
Filename
1303523
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