ليست عنوان مقالات لاتين فني مهندسي History of the International Workshops on Frontiers in Handwriting Recognition Holistic approach for critical system security: Flooding prevention

Hole Transport in Strained $\\hbox {Si}_{0.5} \\hbox {Ge}_{0.5}$ QW-MOSFETs With $\\langle \\hbox {110}\\ra</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>893</div><a href='49/47157.htm'>Hole Transport in Strained and Relaxed SiGe Channel Extremely Thin SOI MOSFETs</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>894</div><a href='49/2297248.htm'>Hole transport in the p-type RTD</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>895</div><a href='49/1147043.htm'>Hole transport in UTB MOSFETs in strained-Si directly on insulator with strained-Si thickness less than 5 nm</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>896</div><a href='49/2917395.htm'>Hole transport is through dye in a PVK-matrix photorefractive polymer</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>897</div><a href='49/2957267.htm'>Hole transport is through dye in a PVK-matrix photorefractive polymer</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>898</div><a href='49/2323748.htm'>Hole transport properties of B-doped relaxed Si/sub 0.7/Ge/sub 0.3/ epitaxial films grown by MBE</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>899</div><a href='49/901153.htm'>Hole Trap Creation in SiO2 by Phosphorus Ion Penetration of Polycrystalline Silicon</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>900</div><a href='49/3846076.htm'>Hole trap generation in the gate oxide due to plasma-induced charging</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>901</div><a href='49/2168334.htm'>Hole trap investigations in supplemental oxygen SIMOX wafers by opposite channel based charge injection</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>902</div><a href='49/1112545.htm'>Hole trapping and breakdown in thin SiO<inf>2</inf></a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>903</div><a href='49/2391627.htm'>Hole Trapping and de-Trapping Effects in LDMOS Devices under Dynamic Stress</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>904</div><a href='49/472708.htm'>Hole Trapping and Hot-Carrier Induced Device Instability in Thin Nitride/Oxide IGFETs</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>905</div><a href='49/3572352.htm'>Hole trapping and hot-hole induced interface trap generation in MOSFET´s at different temperatures</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>906</div><a href='49/1494663.htm'>Hole trapping and trap generation in the gate silicon dioxide</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>907</div><a href='49/3447032.htm'>Hole trapping as the rate-limiting factor in LDD nMOSFET degradation</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>908</div><a href='49/928479.htm'>Hole trapping during low gate bias, high drain bias hot-carrier injection in n-MOSFETs at 77 K</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>909</div><a href='49/415629.htm'>Hole trapping effect on methodology for DC and AC negative bias temperature instability measurements in PMOS transistors</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>910</div><a href='49/871175.htm'>Hole Trapping, Recombination and Space Charge in Irradiated Sandia Oxides</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>911</div><a href='49/774513.htm'>Hole trapping, substrate currents, and breakdown in thin silicon dioxide films [ in FETs ]</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>912</div><a href='49/1005728.htm'>Hole traps in Be-doped MBE InGaP</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>913</div><a href='49/943545.htm'>Hole traps in bulk and epitaxial GaAs crystals</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>914</div><a href='49/1548213.htm'>Hole traps in natural type IIb diamond</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>915</div><a href='49/950435.htm'>Hole traps in n-InP by d.l.t.s. and transient capacitance techniques</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>916</div><a href='49/975926.htm'>Hole traps in n-type Ga<sub>1-x</sub>Al<sub>x</sub>As grown by organometallic vapour phase epitaxy</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>917</div><a href='49/1044532.htm'>Hole traps in silicon dioxides. Part I. Properties</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>918</div><a href='49/1279490.htm'>Hole tunneling current through oxynitride/oxide stack and the stack optimization for p-MOSFETs</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>919</div><a href='49/2764081.htm'>Hole Tunneling Properties in Resonant Tunneling Diodes with Si/Strained Si<sub>0.8</sub>Ge<sub>0.2</sub>Heterostructures Grown on Si</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>920</div><a href='49/3168404.htm'>Hole velocity enhancement in sub-100 nm gate length strained-SiGe channel p-MOSFETs on insulator</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>921</div><a href='49/1253319.htm'>Hole velocity overshoot in partially strain compensated Si<sub>0.793</sub>Ge<sub>0.2</sub>C<sub>0.007</sub> inversion layers [MOSFETs]</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>922</div><a href='49/2212486.htm'>Hole whispering gallery laser of photonic quantum ring</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>923</div><a href='49/2861939.htm'>Hole whispering gallery lasers of photonic quantum ring</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>924</div><a href='49/2845968.htm'>Hole-assisted dual concentric core fibre with ultra large negative dispersion coefficient of −11200 ps/nm/km</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>925</div><a href='49/3095704.htm'>Hole-assisted few-mode multi-core fiber for high-density space-division multiplexing</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>926</div><a href='49/1284594.htm'>Hole-Assisted Few-Mode Multicore Fiber for High-Density Space-Division Multiplexing</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>927</div><a href='49/841467.htm'>Hole-assisted fiber design for small bending and splice losses</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>928</div><a href='49/528224.htm'>Hole-assisted fiber technology for access and long-haul networks</a></div> <div class='valueDiv recordListRow'><div class='rowCountCircle'>929</div><a href='49/799689.htm'>Hole-Assisted Fibers With <formula formulatype=$ $\\lambda _{0}$ Around 1000 nm and Holey Fibers With $\\lambda _{0}$

930

Hole-assisted graded index plastic optical fiber with wow bending loss

931

Hole-assisted multiring fiber with low dispersion around 1550 nm

932

Hole-assisted optical fibre cord identification technique employing visible light without interrupting communication

933

Hole-blocking crystalline-silicon/titanium-oxide heterojunction with very low interface recombination velocity

934

Hole-blocking TiO2/silicon heterojunction for silicon photovoltaics

935

Hole-burning in rare earth doped materials