بر اساس عنوان
48
X-mHMM: an efficient algorithm for training mixtures of HMMs when the number of mixtures is unknown52
XML76
XML API-Based Test Framework of Extension Interface Using Software Mutation Analysis for Component98
XML based robust client-server communication for a distributed telecommunication management system411
XOR in hexagram: On the performance of cooperative network coding in polling-based wireless networks492
Xpipes: A latency insensitive parameterized network-on-chip architecture for multi-processor SoCs522
XPM-induced spectral distortion in high efficiency, picosecond, fiber optical parametric oscillators553
XPS as characterization tool for PV: From the substrate to complete III-V multijunction solar cells554
XPS as characterization tool for PV: From the substrate to complete III-V multijunction solar cells562
XPS studies of sodium compound formation and surface segregation in CIGS thin films [solar cells]684
X-Ray Bremsstrahlung Measurements of an Intense Relativistic Electron Beam Propagating in a Plasma685
X-ray Categorization and Retrieval on the Organ and Pathology Level, Using Patch-Based Visual Words709
X-ray crystal density study on a FZ silicon crystal for the determination of the Avogadro constant714
X-ray CT metal artifact reduction using wavelets: an application for imaging total hip prostheses715
X-ray CTR scattering analysis of As accumulation on GaInAs surface and growth temperature effects749
X-ray diffraction analysis of threading dislocation densities in epitaxial layers as grown by MOCVD760
X-ray diffraction measurements of a femtosecond-laser written waveguides in an YAG single crystal765
X-ray diffraction studies of crystal structures and phase transitions in K809
X-ray emission of relativistic nonquasineutral current structures (nonthermal model of “hot spot”)825
X-Ray Fluorescence Microtomography Investigates the Elemental Distribution in Breast Tissue Samples829
X-ray fluorescent and mid-infrared spectroscopic measurements of vigor information of tomato plant976
X-ray moire pattern in defect-free silicon-on-insulator wafers prepared by oxygen ion implantation