بر اساس عنوان

1
Testing complementary pass-transistor logic circuits
2
Testing complex business process solutions
3
Testing complex couplings in multiport memories
4
Testing Complex Safety-Critical Systems in SOA Context
5
Testing Compliance for IEEE 1159.3
6
Testing Component-Based Real Time Systems
7
Testing component-based software: a cautionary tale
8
Testing Component-Based Web Applications Using Component Automata
9
Testing composite hypotheses about discrete-valued stationary processes
10
Testing Composite Web Services--An Event-Based Approach
11
Testing concept indexing in crosslingual medical text classification
12
Testing concept maps electronically
13
Testing concepts and applications for the Strategic Defense Initiative (SDI)
14
Testing concurrency and communication in distributed objects
15
Testing Concurrent Java Components
16
Testing concurrent programs: a formal evaluation of coverage criteria
17
Testing configurable LUT-based FPGA´s
18
Testing Conformance of Life Cycle Dependent Properties of Mobile Applications
19
Testing conformance on Stochastic Stream X-Machines
20
Testing Consequences of Grime Buildup in Object Oriented Design Patterns
21
Testing considerations for line current differential schemes
22
Testing Considerations for Radiation Induced Latchup
23
Testing constant failure rate against NBAFR alternatives with randomly right-censored data
24
Testing constant-geometry FFT arrays for wafer scale integration
25
Testing Contaminated Insulators at Project UHV for Voltage Levels of the Future
26
Testing content addressable memories using instructions and march-like algorithms
27
Testing content-addressable memories using functional fault models and march-like algorithms
28
Testing context-sensitive middleware-based software applications
29
Testing continuity of grounding grid using the AC current injection method
30
Testing continuous t-norm called Lukasiewicz algebra with different means in classification
31
Testing continuously plated magnetic wire
32
Testing controllability and constructibility in discrete linear systems
33
Testing controllers on ALE III: A low cost mini Autonomous Underwater Vehicle
34
Testing controls to mitigate fatigue loads in the controls Advanced Research Turbine
35
Testing conventional logic and memory clusters using boundary scan devices as virtual ATE channels
36
Testing Convexity or Concavity of a Cumulated Hazard Rate
37
Testing cooperative systems with the mars simulator
38
Testing core-based systems: a symbolic methodology
39
Testing Correlated "BEG-Like" Data for Normality Using a Modified Kolmogorov-Sminov Statistic
40
Testing coverage analysis for software component validation
41
Testing CPU based boards for functionality using bus cycle signature system
42
Testing criteria for data flow software
43
Testing criteria selecting strategy
44
Testing Critical Software: A Case Study for an Aerospace Application
45
Testing crop stress by MODIS vegetation index in the north China plain
46
Testing cross wire opens within complex gates
47
Testing crossbar switch interconnection networks
48
Testing Cross-Platform Mobile App Development Frameworks (T)
49
Testing Cross-Platform Streaming of Video Games over Wired and Wireless LANs
50
Testing Crosstalk Faults of Data and Address Buses in Embedded RAMs
51
Testing cross-talk induced delay faults in static CMOS circuit through dynamic timing analysis
52
Testing current mode two-input logic gates
53
Testing damping formalisms with microwave permeability
54
Testing database transaction concurrency
55
Testing database transactions with AGENDA
56
Testing Database-Centric Applications for Causes of Database Deadlocks
57
Testing Deadline Misses for Real-Time Systems Using Constraint Optimization Techniques
58
Testing decision systems with classification components
59
Testing decomposition of component specifications based on a rule for formal verification
60
Testing defects in scan chains
61
Testing Delay Faults in Asynchronous Handshake Circuits
62
Testing delay faults in embedded CAMs
63
Testing Delegation Policy Enforcement via Mutation Analysis
64
Testing design for power system software
65
Testing design of a social innovation: the environmental mitigation banking system
66
Testing device for surgical grounding plates
67
Testing devices according to an architecture specification
68
Testing dielectric properties of liquids
69
Testing dielectric properties of tissue-equivalent liquid using open-ended coaxial line technique based on the transverse electromagnetic model
70
Testing different ICA algorithms and connectivity analyses on MS patients
71
Testing Different Methods of Forest Height and Aboveground Biomass Estimations From ICESat/GLAS Data in Eucalyptus Plantations in Brazil
72
Testing differential split-level CMOS circuits
73
Testing digital circuits using a Mixed-Signal Automatic Test Equipment
74
Testing digital circuits with constraints
75
Testing digital circuits: guidelines for research
76
Testing digital integrated circuits
77
Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation
78
Testing digital/analog and analog/digital converters
79
Testing distortion estimations in Retinal Prostheses
80
Testing distributed protection systems over the Internet cloud
81
Testing distributed real time systems using a distributed test architecture
82
Testing distributed systems with test cases dependencies architecture
83
Testing distributed, separately developed application
84
Testing distribution switchgear for partial discharge
85
Testing distribution switchgear for partial discharge in the laboratory and the field
86
Testing Distribution Switchgear for Partial Discharge in the Laboratory and the Field
87
Testing Disturbance Faults in Various NAND Flash Memories
88
Testing documentation with “low-tech” simulation
89
Testing domino circuits in SOI technology
90
Testing done by groups of 2 and 3 [electrical engineering education]
91
Testing driver skill for high-speed autonomous vehicles
92
Testing DSM asic with static, δIDDQ, and dynamic test suite: implementation and results
93
Testing DSP cores based on self-test programs
94
Testing DTF method for applicability in a real environment
95
Testing Duration Systems using an approximation method
96
Testing During Refactoring: Adding Aspects to Legacy Systems
97
Testing dynamic accuracy of vector network analyzers using the 40 GHz step attenuator
98
Testing Dynamic Adaptation in Distributed Systems
99
Testing dynamic characteristics of overcurrent relays
100
Testing e-commerce systems: a practical guide
101
Testing EEG data for statistical normality
102
Testing effectiveness of algorithm animation
103
Testing efficiency exploited: Scripted versus exploratory testing
104
Testing Effort Dependent Software FDP and FCP Models with Consideration of Imperfect Debugging
105
Testing EHV secondary arcs
106
Testing EHV Station Insulation for Performance in Contaminated Conditions
107
Testing Einstein´s equivalence principle at Bremen Drop Tower using LTS SQUID technique
108
Testing Elastic Computing Systems
109
Testing elastic systems with surrogate models
110
Testing Elderly People´s Fear of Crime Using a Virtual Environment
111
Testing electric resistivity with method of whirling currents
112
Testing electrical cable-making materials
113
Testing Electrical Insulation of Rotating Machinery with High-Voltage Direct Current [includes discussion]
114
Testing electrical power systems for safety and reliability
115
Testing electrically small antennas with using a fiber optic to RF transducer
116
Testing electricity meters for susceptibility to radio frequency interference
117
Testing electronic products
118
Testing Embedded Cores
119
Testing embedded cores and SOCs-DFT, ATPG and BIST solutions
120
Testing embedded cores by weighted sum of selected node voltages
121
Testing embedded cores using partial isolation rings
122
Testing embedded memories [New Products]
123
Testing embedded memories in telecommunication systems
124
Testing Embedded Memories in the Nano-Era: Will the Existing Approaches Survive?
125
Testing Embedded Memories: Is BIST The Ultimate Solution?
126
Testing Embedded Memories: Is Bist The Ultimate Solution? An Asic Designer´s Point Of View
127
Testing Embedded Memories: Is BIST The Ultimate Solution? Answers to the Key Issues
128
Testing Embedded Memories: Is Bist The Ultimate Solution? Testing Of Embedded Memories-the Aggregate
129
Testing embedded RAMs in ASIC chips
130
Testing Embedded Real Time Systems with TTCN-3
131
Testing embedded real-time systems
132
Testing embedded sequential cores in parallel using spectrum-based BIST
133
Testing embedded single and multi-port RAMs using BIST and boundary scan
134
Testing embedded software by metamorphic testing: A wireless metering system case study
135
Testing embedded systems by using a C++ script interpreter
136
Testing embedded-core based system chips
137
Testing embedded-core-based system chips
138
Testing Engineerng Students: Are We Really Fair?
139
Testing enhancements to the ATSC VSB terrestrial digital television standard
140
Testing Entities in a Parallel Cognitive Language
141
Testing environment for embedded software product lines
142
Testing environment for innovative transport protocols
143
Testing Environment for Real-Time Communications Intensive Systems
144
Testing environment for Vehicle to Grid (V2G) applications for investigating a voltage stability support method
145
Testing equalisation performance in blind adaptation
146
Testing equalities of multiplicative representations in polynomial time
147
Testing equality constraint hypotheses in weighted least squares state estimators
148
Testing equality constraint hypotheses in weighted least squares state estimators
149
Testing Equality of Binomial Parameters Based on Inverse Sampling
150
Testing Equality of Cell Populations Based on Shape and Geodesic Distance
151
Testing Equality of Correlated Exponential Variables
152
Testing equipment for the research of traction battery cells
153
Testing Equipment Properly To The New Pulsed EMI Standards
154
Testing equipment to electrostatic discharge. Case study-communication cables
155
Testing Errors: Data and Calculations in an IC Manufacturing Process
156
Testing Estimator´s Credibility - Part I: Tests for MSE
157
Testing Estimator´s Credibility - Part II: Other Tests*
158
Testing ethernet networks for the ATLAS data collection system
159
Testing Expansion in Bounded-Degree Graphs
160
Testing experience of photovoltaic modules for a multimegawatt power plant
161
Testing experiences on mixed dielectric capacitors for high voltage DC filter applications
162
Testing experimentally the robustness against friction of a force control algorithm
163
Testing Experiments on Synchronized Petri Nets
164
Testing expert systems in process control
165
Testing expert systems using conventional techniques
166
Testing Exponentiality Based on Kullback-Leibler Information With Progressively Type-II Censored Data
167
Testing exponentiality based on the Kullback-Leibler information with the type II censored data
168
Testing exponentiality of the residual life, based on dynamic Kullback-Leibler information
169
Testing extensible design patterns in object-oriented frameworks through scenario templates
170
Testing Facilities for Developing UHV Equipments
171
Testing Facilities for Developing UHV Equipments
172
Testing facility for research and development of Smart-MicroGrid technologies
173
Testing facility using large capacity inverter
174
Testing failure of solder-joints by ESPI on board-level surface mount devices
175
Testing fast ADC´s at sample rates between 20 and 140 MSPS
176
Testing faults in SRAM memory of Virtex-4 FPGA
177
Testing fault-tolerant systems using a unified error model
178
Testing Feature-Rich Reactive Systems
179
Testing finite state machines based on a structural coverage metric
180
Testing finite-state machines: state identification and verification
181
Testing fireproof professional garments under realistic working conditions
182
Testing flash memories
183
Testing Flash Memories for Tunnel Oxide Defects
184
Testing flight systems with machine executable scripts
185
Testing Flip Chip Reliability By The Four Probe Method In Bypass Diode Connected Chain
186
Testing for AMBATM compliance
187
Testing for Application of Motors on ASDs in Class 1, Division 2 Locations
188
Testing for Bridging Faults (Shorts) in CMOS Circuits
189
Testing for chaos of Yangtze River streamflow at different timescales
190
Testing for compliance under absorption-based electromagnetic exposure standards
191
Testing for Concise Representations
192
Testing for convexity with Fourier descriptors
193
Testing for convexity with Fourier descriptors
194
Testing for coupled cells in random-access memories
195
Testing for coupled cells in random-access memories
196
Testing for defective insulators on high tension transmission lines
197
Testing for Defective Insulators on High-Tension Transmission Lines
198
Testing for Dependable Embedded Software
199
Testing for faults in combinational cellular logic arrays
200
Testing for Faults in Wiring Networks
201
Testing for faults, looking for defects
202
Testing for floating gates defects in CMOS circuits
203
Testing for FM-radio interference in motor vehicles
204
Testing for Gaussianity in nonlinear system identification
205
Testing for handover performance based on Android Intelligent Mobile Equipment
206
Testing for harmonizability
207
Testing for High Reliability: A Case Study
208
Testing for human perceptual categories in a physician-in-the-loop CBIR system for medical imagery
209
Testing for Image Symmetries—With Application to Confocal Microscopy
210
Testing for immunity to simultaneous disturbances and similar issues for risk managing EMC
211
Testing for imperfect integration of legacy software components
212
Testing for independence between a point process and an analog signal
213
Testing for Information with Brain Decoding
214
Testing for interconnect crosstalk defects using on-chip embedded processor cores
215
Testing for Intermittent Faults in Digital Circuits
216
Testing for Invariance of Employee Turnover Intention Model: Multi-Group Comparison Between Knowledge Workers and Traditional Staff
217
Testing for Kronecker Separability in Measured Channels
218
Testing for lifetime reliability
219
Testing for Linear and Nonlinear Granger Causality between the Carbon Spot and Futures Prices
220
Testing for linear errors in nonlinear computer programs
221
Testing for linearity of noisy stationary signals
222
Testing for linearity of noisy stationary signals
223
Testing for long memory volatility of Chinese stock markets with FIGARCH model
224
Testing for low breakdown probability with special reference to liquid insulation
225
Testing for microbiological damage of underground organic coatings
226
Testing for millennium risk management
227
Testing for missing-gate faults in reversible circuits
228
Testing for MOS IC Failure Modes
229
Testing for multiple faults in domino-CMOS logic circuits
230
Testing for nonlinearity in non-stationary physiological time series
231
Testing for Non-negativeness of Real Z(jw)
232
Testing for normality of UWB-based distance measurements by the Anderson-Darling statistic
233
Testing for normality using neural networks
234
Testing for numerical computations
235
Testing for Parallelism Among Trends in Multiple Time Series
236
Testing for parametric faults in static CMOS circuits
237
Testing for Parasitic Memory Effect in SRAMs
238
Testing for path delay faults using test points
239
Testing for periodic changes in fundamental constants using long-term comparison of the SYRTE Cs fountains and H-masers
240
Testing for Perturbations of Program Statements
241
Testing for poor responsiveness in android applications
242
Testing for Positive Reality
243
Testing for post seal leakage and jar-to-cover seal leakage in stationary lead acid batteries
244
Testing for presence of kth-rder cyclostationarity
245
Testing for public safety
246
Testing for Quaternion Propriety
247
Testing for Reliability Qualification of Semiconductor Memory Devices
248
Testing for reliability-relevant or misleading?
249
Testing for resistive open defects in FPGAs
250
Testing for resistive opens and stuck opens
251
Testing for resistive shorts in FPGA interconnects
252
Testing for safety — Safety
253
Testing for security during development: why we should scrap penetrate-and-patch
254
Testing for security during development: why we should scrap penetrate-and-patch
255
Testing for Serial Independence of the Residuals in the Framework of Fuzzy Rule-Based Time Series Modeling
256
Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection
257
Testing for SoCs with advanced static and dynamic power-management capabilities
258
Testing for software vulnerability using environment perturbation
259
TESTING FOR SPACE-TIME SEPARABILITY IN FUNCTIONAL MRI
260
Testing for Spatial Heterogeneity in Functional MRI Using the Multivariate General Linear Model
261
Testing for Stationarity in the Frequency Domain Using a Sphericity Statistic
262
Testing for Statistical Significance in Bispectra: A Surrogate Data Approach and Application to Neuroscience
263
Testing for stochastic independence: application to blind source separation
264
Testing for stuck faults in CMOS combinational circuits
265
Testing for survivability in severe environments
266
Testing for systematic defects based on DFM guidelines
267
Testing for systems readiness - a perspective for the future
268
Testing for the "real world" - new tools for new testing needs
269
Testing for the convergence of a linear decision directed equaliser
270
Testing for the Cumulative Flashover Distribution
271
Testing for the new millennium
272
Testing for the programming circuit of LUT-based FPGAs
273
Testing for the shielding quality of EMI gaskets and gasketed joints
274
Testing for Threshold Logic Circuits Based on Resonant Tunneling Diodes
275
Testing for tracking [organic insulating materials]
276
Testing for Transistor Aging
277
Testing for trustworthiness in scientific software
278
Testing for tunneling opens
279
Testing for Unexpected Interactions in AOP
280
Testing for Uniformity in Multidimensional Data
281
Testing for Year 2000 readiness: technical and management issues
282
Testing for Year 2000 readiness-technical and management issues
283
Testing Formal Specifications to Detect Design Errors
284
Testing FPGA based digital system using XILINX ChipScope logic analyzer
285
Testing FPGA based reconfigurable system within run time applications
286
Testing FPGA delay faults in the system environment is very different from "ordinary" delay fault testing
287
Testing FPGA devices on an Automatic Test Equipment
288
Testing FPGAs using JBits RTP cores
289
Testing fractal connectivity in multivariate long memory processes
290
Testing Framework for 4G Wireless Communication Systems
291
Testing Frequency-Domain Causality in Multivariate Time Series
292
Testing from a nondeterministic finite state machine using adaptive state counting
293
Testing from partial deterministic FSM specifications
294
Testing from semi-independent communicating finite state machines with a slow environment
295
Testing fully differential amplifiers using common mode feedback circuit: A case study
296
Testing fully testable systems: A case study
297
Testing Functional Faults in VLSI
298
Testing Functional Fields Of View With The Multi-screen Text Display Device RSG
299
Testing gate-to-channel shorts in BiCMOS logic gates
300
Testing Gaussianity of Multivariate Data Using Entropy
301
Testing Gaussianity with the characteristic function
302
Testing Gbps interfaces without a gigahertz tester
303
Testing general game players against a Simplified Boardgames player using temporal-difference learning
304
Testing general relativity during the cruise phase of the BepiColombo mission to Mercury
305
Testing generality in JANUS: a multi-lingual speech translation system
306
Testing gigabit multilane SerDes interfaces with passive jitter injection filters
307
Testing glucose concentration in aqueous solution based on microwave cavity perturbation technique
308
Testing Goodness-of-Fit for the Singly Truncated Normal Distribution Using the Kolmogorov-Smirnov Statistic
309
Testing goodness-of-fit via rate distortion
310
Testing Governor Performance on Electric Power Systems With Improved Instruments
311
Testing Gravimeters for Lunar Surface Measurements
312
Testing Grid Application Workflows Using TTCN-3
313
Testing harbour patrol and interception policies using particle-swarm-based learning of cooperative behavior
314
Testing HDTV terrestrial broadcasting systems
315
Testing Health-Care Integrated Systems with Anonymized Test-Data Extracted from Production Systems
316
Testing Hierarchical Network-on-Chip Systems with Hard Cores Using Bandwidth Matching and On-Chip Variable Clocking
317
Testing high frequency adcs and dacs with a low frequency analog bus
318
Testing high resolution ADCs using deterministic dynamic element matching
319
Testing high resolution ADCs with low resolution/accuracy deterministic dynamic element matched DACs
320
Testing high speed DRAMs
321
Testing high speed high accuracy analog to digital converters embedded in systems on a chip
322
Testing high speed VLSI devices using slower testers
323
Testing high voltage coils
324
Testing high-frequency and low-power designs: Do the standard rules and tools apply?
325
Testing High-Frequency Electronic Signals With Reflection-Mode Electroabsorption Modulators
326
Testing highly complex system of systems: An industrial case study
327
Testing highly integrated wireless circuits and systems with low cost tester: how to overcome the challenge?
328
Testing High-Reliability Software for Continuous Casting Steel Plants - Experiences and Lessons Learned from Siemens VAI
329
Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs
330
Testing high-speed IO links using on-die circuitry
331
Testing high-speed serial interface technology: is your test solution in synch?
332
Testing high-speed SoCs using low-speed ATEs
333
Testing high-speed, large scale implementation of SerDes I/Os on chips used in throughput computing systems
334
Testing High-Tension Impregnated Paper-Insulated, Lead-Covered Cable
335
Testing high-tension impregnated-paper — Insulated, lead-covered cables
336
Testing high-tension impregnated-paper-insulated, lead-covered cable
337
Testing Homogeneity of Coefficients in Distributed Systems With Application to Quality Monitoring
338
Testing homogeneous spreadsheet grids with the "what you see is what you test" methodology
339
Testing human performance in motion planning over the Internet
340
Testing human-auto cyber team resilience uncovering latent failures with a novel, decision-centered approach
341
Testing Hybrid Technology Cars: Static and Extremely Low-Frequency Magnetic Field Measurements
342
Testing hyperactive faults in asynchronous circuits
343
Testing Hypothesis Concerning Correlation Coefficient with Fuzzy Data
344
Testing hypothesis for signal detection
345
Testing IC accelerometers using Lissajous compositions
346
Testing ICs: getting to the core of the problem
347
Testing ideas of small ENG/ENZ-based antennas using plasma
348
Testing IEC 61850 based multi-vendor substation automation systems for interoperability
349
Testing implications of the Adaptive Market Hypothesis via computational intelligence
350
Testing in a high volume DSM environment
351
Testing in a mixed-signal world
352
Testing in an agile product development environment: An industry experience report
353
Testing in EHS: What is the current status of experimentation?
354
Testing in IEC 61850 - advanced topics and extended possibilities
355
Testing in nanometer technologies
356
Testing in the Cloud: Exploring the Practice
357
Testing in the Distributed Test Architecture: An Extended Abstract
358
Testing in the field
359
Testing in the fourth dimension
360
Testing in the private cloud
361
Testing in the program development cycle
362
Testing in the Year 2020
363
Testing in top-down program development
364
Testing industrall VoIP implementations: registration for SIP phones
365
Testing information delivery methods using augmented reality
366
Testing inheritance hierarchies in the ClassBench framework
367
Testing Inhibited Oils in Circuit Breakers [includes discussion]
368
Testing insulating materials for susceptibility to tracking
369
Testing insulating materials for susceptibility to tracking
370
Testing integrated knowledge-based systems
371
Testing intelligent power supplies for the Los Alamos National Laboratory Accelerator Complex
372
Testing interconnections to static RAMs
373
Testing interconnects for noise and skew in gigahertz SoCs
374
Testing interconnects in a system chip
375
Testing interconnects of dynamic reconfigurable FPGAs
376
Testing interconnects: a pin adjacency approach
377
Testing Interface Thermal Resistance
378
Testing Inter-layer and Inter-task Interactions in RTES Applications
379
Testing intersection of XPath expressions under DTDs
380
Testing Interval Trees for Real-Time Scheduling Systems
381
Testing Inter-Word Coupling Faults of Wide I/O DRAMs
382
Testing Intrusion Detection Systems in MANET: A Comprehensive Study
383
Testing IP cores with pseudo exhaustive test sets
384
Testing is an Event-Centric Activity
385
Testing ISDN protocols
386
Testing issues of standard-beforehand EPON optical network unit transceiver
387
Testing issues on high speed synchronous DRAMs
388
Testing IT: an off-the-shelf software testing process
389
Testing iterative logic arrays for delay faults with a constant number of patterns
390
Testing iterative logic arrays for sequential faults with a constant number of patterns
391
Testing iterative robotic algorithms by their rate of convergence
392
Testing Java Components based on Algebraic Specifications
393
Testing Java Exceptions: An Instrumentation Technique
394
Testing Java interrupts and timed waits
395
Testing Java monitors through deterministic execution
396
Testing Java Swing-based applications
397
Testing jitter in high speed telecommunication systems
398
Testing juntas [combinatorial property testing]
399
Testing laboratory for verification of energy saving using light control
400
Testing Laguerre-Volterra model in a batch reactor
401
Testing LANs optically to the Gigabit Ethernet standard
402
Testing large analog/digital signal processing chips
403
Testing Large Analog/Digital Signal Processing Chips
404
Testing Large ASDS
405
Testing large ASDS
406
Testing Large CICC in Short Sample Configuration and Predicting Their Performance in Large Magnets
407
Testing large circuit-breakers
408
Testing Large Industrial Systems, Preparations and Techniques
409
Testing large scale streaming Internet applications over wireless LANs
410
Testing large software with automated software evaluation systems
411
Testing large stators
412
Testing Large-Air-Circuit-Breaker Trip Devices [includes discussion]
413
Testing last generation MEMS-based AHRS
414
Testing layered interconnection networks
415
Testing layered interconnection networks
416
Testing LCD Source Driver IC with Built-on-Scribe-Line Test Circuitry
417
Testing learning strategies
418
Testing Legacy Embedded Code: Landing on a Software Engineering Desert Island
419
Testing Level 2 ocean products of the ESA Medium Resolution Imaging Spectrometer (MERIS)
420
Testing levels for object-oriented software
421
Testing lifetime performance of primary batteries
422
Testing lightning-flash counters with step-function voltages
423
Testing limits of algorithms associated with high frequency planar electromagnetic analysis
424
Testing Limits of Algorithms Associated with High Frequency Planar Electromagnetic Analysis
425
Testing line current differential relays using real-time digital simulators
426
Testing line optimization based on mathematical modeling from the metamodels obtained from a simulation
427
Testing linear and non-linear analog circuits using moment generating functions
428
Testing linear macros in mixed-signal systems using transient response testing and dynamic supply current monitoring
429
Testing linear separability in classification of inflection rules
430
Testing Linux-based real-time systems: Lachesis
431
Testing List H-homomorphisms
432
Testing lithium niobate boules for integrated optics applications
433
Testing local area network cabling for high speed communications
434
Testing Local Position Invariance with Four H Masers and Four Cs Fountains
435
Testing Location-Based Function Services for Mobile Applications
436
Testing logic cores using a BIST P1500 compliant approach: a case of study
437
Testing Logic Networks and Designing for Testability
438
Testing logic-intensive memory ICs on memory testers
439
Testing Long-Lived Web Services Transactions Using a Risk-Based Approach
440
Testing Lorentz invariance using an asymetric optical resonator
441
Testing Lorentz Invariance Using Zeeman Transitions in Atomic Fountains
442
Testing low voltage network state estimation in RTDS environment
443
Testing low-degree polynomials over prime fields
444
Testing low-resolution DACs using the Generalized Morse Sequence as Stimulus Sequence for Cancelling DC drift
445
Testing Machine Of Hydrodynamic Forces Using Linear Motor
446
Testing Magnetic Air Circuit Breakers for 5-Cycle Performance
447
Testing market alternatives for renewable integration using a reduced network model
448
Testing Massive Modularity Hypothesis through the Selection Task: Content of Rules, Forms of Reasoning, or Pragmatic Expectations? Formal, Content, and Pragmatic Aspects in Human Reasoning
449
Testing measurements and analysis of transient characteristics in power system
450
Testing medical embedded software
451
Testing Memories for Single-Cell Pattern-Sensitive Faults
452
Testing Memory Models
453
Testing memory modules in SRAM-based configurable FPGAs
454
Testing Metglas for use in DARHT accelerator cells
455
Testing Metglas for use in DARHT accelerator cells
456
Testing Method and Experimental Studies on Single Laser Pulse Energy
457
Testing method and platform for power device radiant flux emitters in DC and in impulse
458
Testing method and statistical analysis applied in lightning impulse critical flashover
459
Testing method for porosity foam heat insulation construction material
460
Testing Method for the Flash Intensity of Flash-Bang
461
Testing method of camera dynamic response
462
Testing Method of Code Redundancy Simplification Based on Program Dependency Graph
463
Testing methodologies for analog-to-digital converters
464
Testing methodologies of supercapacitors for load-leveling purposes in industrial applications
465
Testing methodology for cargo radiography systems
466
Testing methodology for FireWire
467
Testing methodology for lifetime extrapolation of PZT capacitors
468
Testing methodology for LOM protection performance assessment
469
Testing methodology for VLSI
470
Testing Methodology of Embedded DRAMs
471
Testing Methodology of Embedded DRAMs
472
Testing methodology of modern digital power system protections
473
Testing Methodology Using SDL for an On-demand Routing Protocol in MANET
474
Testing methods and error budge analysis of a software defined radio
475
Testing methods for a write-assist disturbance-free dual-port SRAM
476
Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs
477
Testing Methods for Gas-Insulated Switchgear
478
Testing methods for integrated circuit of phase locked loops
479
Testing Methods for Measuring the Effects of Stray Capacitances on High-Voltage Current Transformers
480
Testing Methods for Power Cable Insulation
481
Testing Methods for Power Transformer Insulation
482
Testing methods for quaternary content addressable memory using charge-sharing sensing scheme
483
Testing metric relations on Finsler manifolds via a geodesic detecting algorithm
484
Testing Microelectronic Biofluidic Systems
485
Testing micropipelined asynchronous circuits
486
Testing micropipelines
487
Testing microprocessor-based boards (VXI/PXI Plug and Play technology applications)
488
Testing microprocessor-based numerical transformer differential protection
489
Testing microprocessors
490
Testing Microprocessors
491
Testing microwave devices under different source impedance values-a novel technique for on-line measurement of source and device reflection coefficients
492
Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients
493
Testing Microwave Transmission Lines
494
Testing MIMO devices over the air
495
Testing MIMO systems with coupled reverberation chambers: A wideband channel model
496
Testing mission-oriented network reliability via hierarchical mission network
497
Testing mixed signal ASICs through the use of supply current monitoring
498
Testing mixed signal integrated circuits
499
Testing mixed signal SOCs
500
Testing mixed-signal cores
501
Testing mixed-signal cores: a practical oscillation-based test in an analog macrocell
502
Testing mixed-signal cores: practical oscillation-based test in an analog macrocell
503
Testing Mixed-Signal Devices
504
Testing mobile agent platforms over the air
505
Testing Model-Processing Tools for Embedded Systems
506
Testing models of attention with MEG
507
Testing models of I/V characteristics of planar-doped barrier diodes
508
Testing Modern Option Pricing Theory on the Early-warning of Financial Distress
509
Testing Modularity of Local Supervisors: An Approach Based on Abstractions
510
Testing molecular devices in CMOS/nano integrated circuits
511
Testing monotonicity
512
Testing MPI threshold in bend insensitive fiber using coherent peak-to-peak power method
513
Testing MR Safety and Compatibility
514
Testing MRAM for Write Disturbance Fault
515
Testing MRI and image analysis techniques for fat quantification in meat science
516
Testing multichip modules
517
Testing Multichip Modules and Bare Die Using Vision Probing Techniques
518
Testing Multiclass Pattern Discrimination
519
Testing multimedia transmission systems
520
Testing Multimodal Integration Hypotheses with Application to Schizophrenia Data
521
Testing multinormality based on generalized inverse
522
Testing multiple hypotheses through IMP weighted FDR based on a genetic functional network with application to a new zebrafish transcriptome study
523
Testing multiple laser systems on the Chameleon EO system: a single target approach
524
Testing multiple power connections with boundary scan
525
Testing Multirobot Algorithms: SAETTA: A Small and Cheap Mobile Unit
526
Testing Multithreaded Programs with Contextual Unfoldings and Dynamic Symbolic Execution
527
Testing multivariate Gaussianity with the characteristic function
528
Testing MVMO on learning-based real-parameter single objective benchmark optimization problems
529
Testing nacelles of wind turbines with a hardware in the loop test bench
530
Testing nanometer digital integrated circuits: myths, reality and the road ahead
531
Testing NASA´s 3D-stack MCM space flight computer
532
Testing Needs for ITER ECH Transmission Line Components
533
Testing network protocols via the DESERT underwater framework: The CommsNet´13 experience
534
Testing Network-on-Chip Communication Fabrics
535
Testing neutralization of adversary aircraft
536
Testing New Parameters for Wind Complexity Assessment From ASCAT Measurements
537
Testing nickel cadmium batteries for remote telecom power applications
538
Testing nondeterminate systems
539
Testing Non-Functional Requirements with Aspects: An Industrial Case Study
540
Testing non-uniform gaps with oscillatory switching surges
541
Testing numerical transformer differential relays
542
Testing numerical transformer differential relays
543
Testing numerical transformer differential relays
544
Testing object-oriented programs - an integrated approach
545
Testing object-oriented software
546
Testing Obligation Policy Enforcement Using Mutation Analysis
547
Testing of "Venetian-Blind" silicon microstructures with optical methods
548
Testing of 10 GHz Instantaneous Bandwidth RF Spectrum Monitoring at Idaho National Labs
549
Testing of 10 MW multibeam klystrons for the european X-ray fel at DESY
550
Testing of 110 kV cables by resonant converter
551
Testing of 1-PIN blanket mockup: analysis of the experimental results
552
Testing of 2.5kW low temperature stirling engine for distributed solar thermal generation
553
Testing of 3D chips: Is there anything new under the sun?
554
Testing of 3D IC with minimum power using genetic algorithm
555
Testing of 3D-stacked ICs with hard- and soft-dies - a Particle Swarm Optimization based approach
556
Testing of 3-Meter Prototype Fault Current Limiting Cables
557
Testing of 800 and 1200 kV class circuit breakers
558
Testing of 800 and 1200 kV class circuit breakers
559
Testing of a 0.850 THz vacuum electronic power amplifier
560
Testing of a 1.5-m reflector antenna at 322 GHz in a CATR based on a hologram
561
Testing of a 1.5-m single-phase short-sample cable made with copper laminated HTS tapes at ORNL
562
Testing of a 100-kV 100-Hz Rep-Rate Gas Switch
563
Testing of a 1100 kV, 3 to 9 CVA Underground Transmission System
564
Testing of a 1100 kV, Three to Nine GVA Underground Transmission System
565
Testing of a 13.8 kV air-magnetic breaker in a steam environment
566
Testing of a 130kA 10kV Light Activated Semiconductor Switch
567
Testing of a 1-MV linear transformer driver (LTD) for radiographic applications
568
Testing of a 3 MW, 140 GHz coaxial cavity gyrotron
569
Testing of a 32-bit High Performance Embedded Microprocessor
570
Testing of a 470 ampere RMS 2000 volt regenerative gate turn-on thyristor
571
Testing of a 50 kA, 50 kV current interrupter with I2t preheating and long recovery voltage
572
Testing of a close spaced thermionic converter
573
Testing of a controller for a hybrid capillary pumped loop thermal control system
574
Testing of a controller for an ETO-based STATCOM through controller hardware-in-the-loop simulation
575
Testing of a cost-effective photovoltaic thermal hybrid solar collector prototype
576
Testing of a coupled ice-ocean model in a sea ice forecasting system
577
Testing of a Covered Conductor’s Fault Detectors
578
Testing Of A Crear Righ-Efficiency Combined Boiler
579
Testing of a cryocooler-cooled HTS magnet with silver-sheathed Bi2223 tapes for silicon single-crystal growth applications
580
Testing of a diagnostic technique for a single PEM fuel cell based on a DC/DC converter
581
Testing of a Diagnostic Ultrasonic Array Probe and Estimation of the Acoustic Power Using Radiation Conductance
582
Testing of a distributed generation system with a virtual grid
583
Testing of a Failure Accommodation System on a Highly Flexible Grid
584
Testing of a Ground Coupled Heat Pump
585
Testing of a gyroscopic Wave Energy System
586
Testing of a HIFU probe for the treatment of superficial venous insufficiency by using MRI
587
Testing of a high current DC ESQ accelerator
588
Testing of a high performance, precision-bore railgun
589
Testing of a high-efficiency domestic heating system
590
Testing of a Highly Reconfigurable Processor Core for Dependable Data Streaming Applications
591
Testing of a homopolar generator, energy storage inductor, opening-switch railgun system
592
Testing of a LIGA-microspectrometer for monitoring dissolved nickel concentration when etching nickel and its alloys in aqueous ferric chloride solutions
593
Testing of a Lightweight Coreless HTS Synchronous Generator Cooled by Subcooled Liquid Nitrogen
594
Testing of a lightweight SiC power module for avionic applications
595
Testing of a long-term fall detection system incorporated into a custom vest for the elderly
596
Testing of a low inductance stacked mosfet switch for Pulsed Ring Down Sources
597
Testing of a low-resistance joint of CICC for Indian tokamak SST-1
598
Testing of a low-VMIN data-aware dynamic-supply 8T SRAM
599
Testing of a microanalysis system
600
Testing of a modified particle swarm optimization algorithm using different benchmark functions
601
Testing of a modular over-voltage trigger device for marx generators
602
Testing of a new DC/DC converter topology for integrated wind-photovoltaic generating systems
603
Testing of a NORA CMOS serial-parallel multiplier
604
Testing of a novel medium voltage impedance measurement unit
605
Testing of a one dimensional model for Field II calibration
606
Testing of a parallel ternary multiplier using I2L logic
607
Testing of a practical low pressure permeator
608
Testing of a Predictive Control Strategy for Balancing Renewable Sources in a Microgrid
609
Testing of a prototype high temperature superconducting current lead
610
Testing of a Prototype PWR Design Gamma Thermometer for Use as a Local Power Monitor in the Thimble Tube of a Nuclear Reactor
611
Testing of a rapid-fire compensated pulsed alternator system
612
Testing of a raster magnet system for expanding the APT proton beam
613
Testing of a Reactor Control System in Closed-Loop
614
Testing of a Resistive Fault Current Limiter Component Based on Bi-2212 Bifilar Coil
615
Testing of a signals synthesis module using LabVIEW software
616
Testing of a simulated rotor system supported on gas foil bearings for a Microturbine
617
Testing of a Spacecraft Model in a Combined Environment Simulator
618
Testing of a spatial impulse response algorithm for double curved transducers
619
Testing of a statistical approach for local ionospheric disturbances detection
620
Testing of a superconducting spectrometer dipole
621
Testing of a telecommunication protocol using constraint programming
622
Testing of a wavelet packet transform-based differential protection for resistance-grounded three-phase transformers
623
Testing of a Wavelet-Packet-Transform-Based Differential Protection for Resistance-Grounded Three-Phase Transformers
624
Testing of active current balance in parallel thyristor bridges
625
Testing of advanced distance protection relays
626
Testing of Advanced Driver Assistance Towards Automated Driving: A Survey and Taxonomy on Existing Approaches and Open Questions
627
Testing of advanced permanent magnet machines for a wide range of applications
628
Testing of Advanced Transmission Line Protection Relays
629
Testing of algorithms for a stand-alone digital relay for power transformers
630
Testing of alpha-stable distributions with the characteristic function
631
Testing of an air-core compulsator driven 0.60 caliber railgun system
632
Testing of an EM induction platform for UXO discrimination on a seeded site with real exploded shell fragment clutter
633
Testing of an FPGA Based C2X-Communication Prototype with a Model Based Traffic Generation
634
Testing of an HTS Power Cable Made From YBCO Tapes
635
Testing of an inductive current-limiting device based on high-T/sub c/ superconductors
636
Testing of an off-chip NoC protocol using a BIST/Synthesizable Testbench approach
637
Testing of an on-board emergency flight planner
638
Testing of an optical feedback pixel driver using supply current
639
Testing of analog integrated circuits based on power-supply current monitoring and discrimination analysis
640
Testing of analog neural array-processor chips
641
Testing Of Analog Systems Using Behavioral Models And Optimal Experimental Design Techniques
642
Testing of Analog/Mixed Signal ICs: Past, present and future
643
Testing of analogue and mixed-signal circuits by using supply current measurements
644
Testing of analogue circuits via (standard) digital gates
645
Testing of analogue to digital converter macros in ASICs
646
Testing of anti-islanding protections for grid-connected inverters
647
Testing of asynchronous designs by "inappropriate" means. Synchronous approach
648
Testing of Asynchronous NULL Conventional Logic (NCL) Circuits
649
Testing of Asynchronous NULL Conventional Logic (NCL) Circuits in Synchronous-Based Desig
650
Testing of atmospheric opacity during sun observations with MSRT
651
Testing of automated systems
652
Testing of automotive electronic components regarding influence of electromagnetic field strength levels radiated by lightning discharges-application to a multiplexing communication system
653
Testing of autonomous agents: A critical analysis
654
Testing of biometric systems integrated in mobile devices
655
Testing of Bluetooth products in the industrial environment
656
Testing of BS 9000 components
657
Testing of cable insulation for aerospace applications
658
Testing of ceiling fans
659
Testing of Changing Requirement in an Agile Environment - A Case Study of Telecom Project
660
Testing of circuit breakers using coil current characteristics analysis
661
Testing of circular waveguides using a resonant cavity method
662
Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip
663
Testing of clustering
664
Testing of coaxial railguns in high vacuum
665
Testing of combinational majority and minority logic networks
666
Testing of commercial optical media
667
Testing of commercial optical media
668
Testing of compact bolted fasteners with insulation and friction-enhanced shims for NCSX
669
Testing of complex gates
670
Testing of Component-Based Software: A Metamorphic Testing Methodology
671
Testing of Component-Based Systems
672
Testing of composite hypotheses and ID-codes
673
Testing of Composite Overhead Ground Wire Containing Optical Fibers
674
Testing of Composite Overhead Ground Wire Containing Optical Fibers
675
Testing of computations by polynomial checks
676
Testing of computer numerical control (CNC) machinery to comply with EMC directives
677
Testing of concurrent programs after specification changes
678
Testing of concurrent programs based on message sequence charts
679
Testing of concurrent software
680
Testing of contactors under voltage sag and non-sinusoidal voltage conditions
681
Testing of Conventional Antennas for High Altitude Airborne Cellular Base Stations
682
Testing of converter-fed drives in the type of protection increased safety "e" and special problems
683
Testing of cooperative tasks for Unmanned Aerial and ground platforms
684
Testing of Copper Pillar Bumps for Wafer Sort
685
Testing of core-based systems-on-a-chip
686
Testing of Cr:ZnSe laser with intracavity methane cell in 77–300 K temperature range
687
Testing of critical paths for delay faults
688
Testing of crosstalk-type dynamic faults in interconnection networks with use of Ring LFSRs
689
Testing of current transformers
690
Testing of data paths in VLSI arrays
691
Testing of D-C Interrupters on A-C Test Circuits [includes discussion]
692
Testing of deep-submicron battery-operated circuits using new fast current monitoring scheme
693
Testing of detection systems
694
Testing of Diesel Electric Generating Sets for Nuclear Service
695
Testing of differential cascade voltage switch (DCVS) circuits
696
Testing of differential cascode voltage switch one-count generators
697
Testing of DiffServ performance over a U.S. Navy satellite communication network
698
Testing of digital circuitry using Xilinx chipscope logic analyzer
699
Testing of digital controllers using real-time hardware in the loop simulation
700
Testing of Digital Microfluidic Biochips Using Improved Eulerization Techniques and the Chinese Postman Problem
701
Testing of digital microfluidic biochips with arbitrary layouts
702
Testing of digital system in real-time applications
703
Testing of digital systems
704
Testing of Digital Systems [Book Review]
705
Testing of digital television broadcasting from the stratosphere
706
Testing of digitally assisted adaptive analog/RF systems using tuning knob — Performance space estimation
707
Testing of Distributed Fiber Optical Strain Sensors for Long Term Surveillance of a Stay Cable Bridge .
708
Testing of distributed IEC 61850 based protection schemes
709
Testing of distribution arresters
710
Testing of Distribution Arresters
711
Testing of domino and latched domino circuits using current sensors
712
Testing of Doppler tolerant range sidelobe suppression in pulse compression meteorological radar
713
Testing of double-layer capacitors for high reliability applications
714
Testing of droplet-based microelectrofluidic systems
715
TESTING OF DRY MECHANICAL VACUUNI PUMPS FOR ITER
716
Testing of dual-junction SCARLET modules and cells plus lessons learned
717
Testing of dynamic logic circuits based on charge sharing
718
Testing of dynamic quality of AD modules with standard interfaces and problems connected with it
719
Testing of early applied LTE-Advanced technologies on current LTE service to overcome real network problem and to increase data capacity
720
Testing of EDTV and IDTV Systems Experiences and Recommendations
721
Testing of EDTV and IDTV systems-experiences and recommendations
722
Testing of electric machinery and of materials for its construction
723
Testing of Electrical Equipment for Use in Hazardous Locations
724
Testing of electrical installations in factories
725
Testing of Electrical Machine Stator Coils Using Sharp-Fronted Impulse Voltage
726
Testing of Electrical Machines
727
Testing of electrical machines in periodical and quasi-periodical conditions, using a data acquisition and processing system
728
Testing of electrical machines using power electronic converters
729
Testing of Electronic Healthcare Record images and reports viewer
730
Testing of electronic industries association land-mobile communication antenna gain standards at the national bureau of standards
731
Testing of electronic industries association land-mobile communication antenna gain standards at the national bureau of standards
732
Testing of elevator buffers by electrical means
733
Testing of Elevator Buffers by Electrical Means
734
Testing of embedded A/D converters in mixed-signal circuit
735
Testing of embedded system using fault modeling
736
Testing of engine-generators for outside plant applications
737
Testing of Evolving Protocols
738
Testing of fail-safe software in implantable devices
739
Testing of fault-tolerant and real-time distributed systems via protocol fault injection
740
Testing of fault-tolerant hardware through partial control of inputs
741
Testing of fillet emitter structures with well defined emitter-to-gate spacings
742
Testing of filter technologies for ballast water treatment
743
Testing of first and second order delta-sigma converters for catastrophic faults
744
Testing of fixed broadband wireless systems at 5.8 GHz
745
Testing of flow-based microfluidic biochips
746
Testing of Flow-Based Microfluidic Biochips: Fault Modeling, Test Generation, and Experimental Demonstration
747
Testing of fluorescent lamps for its flickering susceptibility towards interharmonic voltages
748
Testing of full size high current superconductors in SULTAN III
749
Testing of function that have small width branching programs
750
Testing of Gas Insulated Substations and Transmission Systems
751
Testing of genetic-PI based controller for IPMSM drive
752
Testing of global control performance for open water channels
753
Testing of glue logic interconnects using boundary scan architecture
754
Testing of graphite paste properties for thick film sensors
755
Testing of ground conductors with artificially generated lightning current
756
Testing of hard faults in simultaneous multi-threaded processors
757
Testing of harmonic restraint relays with single frequency sources
758
Testing of heating in a black test corner
759
Testing of high current by-pass diodes for the LHC magnet quench protection
760
Testing of High Energy Density Capacitors
761
Testing of high energy density capacitors
762
Testing of high gravity flooded batteries for high rate utility applications
763
Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation
764
Testing of High Speed Distance Relays
765
Testing of high speed distance relays
766
Testing of high temperature superconductors for cryogenic current lead applications
767
Testing of high voltage components and systems
768
Testing of high voltage systems installed in hybrid and electric vehicles
769
Testing of high-power semiconductor laser bars
770
Testing of high-resolution / middle-speed A/D converters and modules problems and ways of their solving
771
Testing of high-speed DACs using PRBS generation with “Alternate-Bit-Tapping”
772
Testing of high-voltage power transformers
773
Testing of high-voltage power transformers
774
Testing of HOM Coupler Designs on a Single Cell Niobium Cavity
775
Testing of Hybrid Real-time Systems Using FPGA Platform
776
Testing of Image Processing Algorithms on Synthetic Data
777
Testing of imbedded memories in ASICs
778
Testing of inductively coupled Eddy Current Position Sensor of Diverse Safety Rod in sodium
779
Testing of industrial Nb3Sn strands for high field fusion magnets
780
Testing of infrared spectroradiometer using blackbody
781
Testing of insulating materials at high frequencies and high voltage based on the tesla transformer principle
782
Testing of insulation for moisture resistance in a motor under operational stress
783
Testing of integrated auto-switching substation systems
784
Testing of integrated IGBT module/heat-pipe cooler system
785
Testing of intelligent robots, development and experience
786
Testing of interconnection circuits in wafer-scale arrays
787
Testing of interconnections with use of reduced-size signature-based diagnostic dictionary
788
Testing of inter-word coupling faults in word-oriented SRAMs
789
Testing of IR Image Enhancement Algorithm on Maritime Objects
790
Testing of ISDN protocols
791
Testing of ITER central solenoid coil insulation in an array
792
Testing of ITER prototype cable-in-conduit conductors in the FENIX facility
793
Testing of iterative logic arrays
794
Testing of large aperture superferric quadrupoles
795
Testing of large area drift chambers at the Saskatchewan Accelerator Laboratory for High Energy Astrophysics
796
Testing of Large Lead Stationary Batteries
797
Testing of Large Lead Stationary Batteries
798
Testing of large motors to API 541 and API 546 standards
799
Testing of large motors to API 542 and 546 standards
800
Testing of large number multiplication functions in cryptographic systems
801
Testing of large telecommunication installations
802
Testing of laser optical components for space-based laser systems
803
Testing of latch based embedded arrays using scan tests
804
Testing of lattice towers for Ontario Hydro transmission line refurbishment program
805
Testing of Level Shifters in Multiple Voltage Designs
806
Testing of Lightning Protective System of a Residential Structure: Comparison of Data Obtained in Rocket-Triggered Lightning and Current Surge Generator Experiments
807
Testing of linearity in weak sense for time series based on the bispectrum
808
Testing of lithium polymer batteries in outside power cabinet for telecommunication system
809
Testing of Logic Blocks Using Built-In Self Test Scheme for FPGAs
810
Testing of low voltage two stage operational amplifier using oscillation test methodology
811
Testing of Low-Cost Digital Microfluidic Biochips with Non-regular Array Layouts
812
Testing of low-current contacts quality and reliability by using third harmonic distortion
813
Testing of low-voltage motor turn insulation intended for pulse-width modulated applications
814
Testing of LTE devices in transmit diversity enabled system using reverberation chamber
815
Testing of LUT delay aliasing faults in SRAM based FPGAs using half-frequencies
816
Testing of Main Turbine-Generator Insulation [includes discussion]
817
Testing of materials shielding effectiveness against electromagnetic pulse
818
Testing of mechanical joints in aluminium conductors
819
Testing of mechanical joints in aluminium conductors for insulated cables
820
Testing of megawatt-class gyrotrons
821
Testing of megawatt-class gyrotrons
822
Testing of Memory Leak in Android Applications
823
Testing of MEMS material properties and stability
824
Testing of MEMS Structure by Atomic Force Microscope
825
Testing of MEMS-based microsystems
826
Testing of metal gate PMOS digital integrated circuits
827
Testing of microprocessor devices on the basis of artificial neural networks with changeable parameters
828
Testing of microwave shielding gaskets and cover panels-recent work at Rome Laboratories
829
Testing of Middle-resolution Digitisers at Input Signal Frequency of 1 MHz
830
Testing of millimeter wave systems
831
Testing of milliwatt power source components
832
Testing of Minuteman launch facility flooded lead acid batteries for service life projection
833
Testing of mixed signal (analogue and digital) circuits (ASIC and board level) using current monitoring techniques
834
Testing of mixed-signal systems using dynamic stimuli
835
Testing of MMW radar performance in adverse weather conditions and clutter backgrounds
836
Testing of mobile surveillance robot at a nuclear power plant
837
Testing of model structures in identification of metabolic systems
838
Testing of MOS Combinational Networks - A Procedure for Efficient Fault Simulation and Test Generation
839
Testing of motor unit synchronization model for localized muscle fatigue
840
Testing of Multifunctional Distance Protection Relays
841
Testing of multifunctional distribution protection relays
842
Testing of multimedia content transmission in wireless 802.11n network
843
Testing of multiple-output domino logic (MODL) CMOS circuits
844
Testing of multiple-output domino logic (MODL) CMOS circuits
845
Testing of nano-insulation materials: Some ideas, some experiences
846
Testing of neurosurgical needle steering via duty-cycled spinning in brain tissue in vitro
847
Testing of new fault location method for medium voltage networks
848
Testing of new ferroelectric elements custom engineered for explosively driven ferroelectric applications
849
Testing of New Ferroelectric Elements Custom Engineered for Explosively Driven Ferroelectric Generator Applications
850
Testing of new models of the human visual system for image quality evaluation
851
Testing of New Services
852
Testing of non-traditional acoustical materials
853
Testing of Non-volatile Logic-Based System Chips
854
Testing of normality of data files for application of SPC tools
855
Testing of N-stage pipelined ADC using test input regeneration and sliding window techniques
856
Testing of object-oriented programs based on finite state machines
857
Testing of one stage Pipelined Analog to Digital Converter
858
Testing of optical fiber components for harsh environmets
859
Testing of packaging materials for improved PV module reliability
860
Testing of parallel programs based on primitive dependence graph
861
Testing of Phasor Measurement Units
862
Testing of phasor measurement units
863
Testing of photolytic uncaging with intraspinal fiber optics as a basis for motor neuroprostheses
864
Testing of photovoltaic concentrator modules
865
Testing of physical, mechanical and chemical properties of flakes and granules from thermoplastic WEEE selected by components
866
Testing of pixellated CZT and CdTe detectors at the 200µm level
867
Testing of policy-based dynamic spectrum access radios
868
Testing of PolPA authorization systems
869
Testing of portable tele-medical power supply
870
Testing of power and distribution cables for the petrochemical industries in Saudi Arabia
871
Testing of Power Cables for the Pulp and Paper Industry
872
Testing of power connectors-influence of testing parameters
873
Testing of Power Electronic Modules for Distributed Systems at the National Center for Reliable Electric Power Transmission
874
Testing of Precision DAC Using Low-Resolution ADC With Wobbling
875
Testing of Precision DACs Using Low-Resolution ADCs with Dithering
876
Testing Of Programmable Analog Neural Network Processors
877
Testing of programmable logic devices (PLD) with faulty resources
878
Testing of Properties for Soldered Leadless Chip Carrier Assemblies
879
Testing of Proposed Atv Systems
880
Testing of pumping speed of miniature sputtering ion pump
881
Testing of PV module efficiency in naval conditions
882
Testing of quantum cellular automata
883
Testing of quantum dot cellular automata based designs
884
Testing of rail vehicles for higher speeds on existing lines
885
Testing of Railroad Signal Equipment for Power Line Interference Suceptibility Part I: the Test Jig
886
Testing of Railroad Signal Equipment for Power Line Interference Suceptibility Part II: Test Results
887
Testing of Railroad Signal Equipment for Power Line Interference Susceptibility, Part I: The Test Jig
888
Testing of Railroad Signal Equipment for Power Line Interference Susceptibility, Part II: Test Results
889
Testing of random access memories: theory and practice
890
Testing of Reactor Switching for UHV Circuit Breakers
891
Testing of real-time systems on the desktop
892
Testing of reliability-Analysis tools
893
Testing of resistive bridging faults in CMOS flip-flop
894
Testing of resistive opens in CMOS latches and flip-flops
895
Testing of RF 100 m TF Qualification Conductor in the SULTAN Test Facility
896
Testing of safety-critical systems: An aerospace launch application
897
Testing of scan circuits containing nonisolated random-logic legacy cores
898
Testing of sensor condition using Gaussian mixture model
899
Testing of Several CT Performance Phantoms for Medical Imaging
900
Testing of several overlapping optimization methods for bin-packing problem
901
Testing of SF6- and vacuum generator circuit breakers
902
Testing of shipboard power systems: a case for remote testing and measurement
903
Testing of Smart Charging Controller for dynamic charging from solar panels
904
Testing of SoCs with Hierarchical Cores: Common Fallacies, Test Access Optimization, and Test Scheduling
905
Testing of solar cells for the Solar Probe Plus mission
906
Testing of solid-core insulators for use on br 25 kV electrification
907
Testing of spark gap irreversibility under conditions of operation
908
Testing of Stellar-Inertial Guidance Systems
909
Testing of stuck-open faults in generalised Reed-Muller and EXOR sum-of-products CMOS circuits
910
Testing of Stuck-Open Faults in Nanometer Technologies
911
Testing of Switch Blocks in Three-Dimensional FPGA
912
Testing of switch blocks in TSV-reduced Three-Dimensional FPGA
913
Testing of TAMU1: A single-aperture block-coil dipole
914
Testing of technical security equipment for stability to intentional electromagnetic interference
915
Testing of techniques for improvement of conductivity of electrically conductive adhesives
916
Testing of telecom and datacom signals with a wide-bandwidth sampling oscilloscopes
917
Testing of telecommunications hardware [Guest Editorial]
918
Testing of TFTR´s remote maintenance manipulator
919
Testing of the 2.4 GHz Band Spread Spectrum Sound Transceiver Unit Using an Elastic Type SAW Convolver
920
Testing of the A6 magnetron with radial extraction on the pulserad electron beam accelerator
921
Testing of the backward wave oscillator model by using the spectral characteristics of VLF chorus elements
922
Testing of the Beckwith Electric M-0430 multifunction protection relay using a real-time digital sim
923
Testing of the cannon caliber rapid fire railgun
924
Testing of the Ceramic Insulation Break for Fusion Device
925
Testing of the dependence of the number of layers on the performance of a one-meter HTS transmission cable section
926
Testing of the Euratom LCT coil in the toroidal arrangement of the International Fusion Superconducting Magnet Test Facility without external pulsed fields (standard-I) and with them (standard II) and an extended single-coil test
927
Testing of the Euratom LCT-coil, a forced-flow cooled NbTi coil, in the international fusion superconducting magnet test facility (IFSMTF)
928
Testing of the FDC based excitation current regulator
929
Testing of the grid-connected photovoltaic systems using FPGA-based real-time model
930
Testing of the GSM-R system against electromagnetic disturbances present in the railway environment
931
Testing of the high accuracy inertial navigation system in the Shuttle Avionics Integration Laboratory
932
Testing of the HP G-Link chip set for an event builder application
933
Testing of the HP G-link chip set for an event builder application
934
Testing of the LHC Magnets in Cryogenic Conditions: Operation Challenges, Status and Outlook
935
Testing of the MESSENGER spacecraft phased-array antenna
936
Testing of the methods of real-time MTIE calculation
937
Testing of the MITL and POS for the Decade Quad
938
Testing of the Modal Dynamic Equivalents Technique
939
Testing of the New Tuner Design for the CEBAF 12 GeV Upgrade SRF Cavities
940
Testing of the pool-boiling cooled Japanese LCT coil in the international fusion superconducting magnet test facility
941
Testing of the rapidly developed prototypes
942
Testing of the SNS Superconducting Cavities and Cryomodules
943
Testing of the spatial resolution and efficiency of scintillating fiber PET modules
944
Testing of the spatial resolution and efficiency of scintillating fiber PET modules
945
Testing Of The SSC DTL And CCL Klystron Modulators
946
Testing of the ST9 Microcontroller
947
Testing of the STM4-120 kinematic Stirling engine for solar thermal electric systems
948
Testing of the Superconducting Magnet and Cryogenics for the AMS-02 Experiment
949
Testing of the thermal-stress-cracking characteristics of silver-refractory contacts
950
Testing of the timing signals monitoring principles
951
Testing of the Uniformity of Color Appearance Space
952
Testing of the world´s largest Bi-2223 high temperature superconducting coil
953
Testing of the world´s largest HTS experimental magnet with Ag-sheathed Bi-2223 tapes for Si single crystal growth applications
954
Testing of three-phase equipment under voltage sags
955
Testing of three-stage switching networks for coupling faults
956
Testing of Timer Function Blocks in FBD
957
Testing of Timing Properties in Real-Time Systems: Verifying Clock Constraints
958
Testing of traffic information service broadcast (TIS-B) and ADS-B at Memphis International Airport
959
Testing of transformer sheet steel
960
Testing of transmission-line insulators under deposit conditions
961
Testing of transport system management strategy
962
Testing Of Trapezoidal Integration With Damping For The Solution Of Power Transient Problems
963
Testing of Trapezoidal Integration With Damping for the Solution of Power Transient Problems
964
Testing of Trusted CMOS Data Converters
965
Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits
966
Testing of two date change detection using a modified enhancement classification method
967
Testing of UCA based microprocessor based protective relays
968
Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD)
969
Testing of UltraSPARC T1 Microprocessor and its Challenges
970
Testing of Uncustomized Segmented Channel Field Programmable Gate Arrays
971
Testing Of Updated Program For ECG Analysis
972
Testing of usability of tabbing ribbons adhesive assembly in PV modules production
973
Testing of User-Configurable Software Systems Using Firewalls
974
Testing of vacuum circuit breakers: specific issues and developments
975
Testing of vacuum circuit breakers: specific issues and developments
976
Testing of vacuum system for APT/LEDA RFQ
977
Testing of valve-type lightning arresters
978
Testing of Vega2, a chip multi-processor with spare processors.
979
Testing of very large systems: a hierarchical approach to fault coverage evaluation
980
Testing of VLSI CMOS System/390 processor at card and system level
981
Testing of VLSI regular arrays
982
Testing of Wearable Monitors in a Real-World Hospital Environment: What Lessons Can Be Learnt?
983
Testing of web services - A systematic mapping
984
Testing of Web Services: Tools and Experiments
985
Testing of Wide Area Protection, Monitoring and Control Systems
986
Testing of wideband digital coders
987
Testing of winter vegetation construction and water purification effect of a cascaded wetland model of Jialu river
988
Testing of wireless heterogeneous networks
989
Testing of zipper CMOS logic circuits
990
Testing of zipper CMOS logic circuits
991
Testing OFDM-based positioning using the digital TV signals
992
Testing olfactory models with an artificial experimental platform
993
Testing omnidirectional vision-based Monte Carlo localization under occlusion
994
Testing on depth profile of seawall by using the method of ground penetrating radar
995
Testing on SS-type terminal section radio equipment for practical use [traffic signal control]
996
Testing On-Die Process Variation in Nanometer VLSI
997
Testing On-Die Process Variation in Nanometer VLSI
998
Testing online and print user documentation
999
Testing online helps with paper and pencil
1000
Testing Open Defects in Memristor-Based Memories