بر اساس عنوان
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Deep-submicron CMOS design of high-performance low-power flash/folding analog-to-digital converters118
Defcon217
Defect chalcopyrite Cu(In1-xGax)3Se5 materials and high Ga-content Cu(In,Ga)Se2-based solar cells282
Defect density evaluation in a high-k MOSFET gate stack combining experimental and modeling methods297
Defect detection and classification using a SQUID based multiple frequency eddy current NDE system326
Defect Detection in Textiles Using Morphological Analysis of Optimal Gabor Wavelet Filter Response331
Defect detection in thick aircraft samples based on HTS SQUID-magnetometry and pattern recognition416
Defect generation and propagation in mc-Si ingots: Influence on cell-to-cell performance variation491
Defect observation of AlInGaP irradiated with 30 keV protons for multi-junction space solar cells500
Defect parameter extraction in backend process steps using a multilayer checkerboard test structure529
Defect recognition via longitudinal mode analysis of high power broad area QW semiconductor lasers567
Defect Size Effect and Defect Band Conduction of Ultrathin Oxides After Degradation and Breakdown571
Defect states with an occupation-dependent lattice configuration in zinc-doped Ga591
Defect Tolerance Based on Coding and Series Replication in Transistor-Logic Demultiplexer Circuits649
Defect-based methodology for workload-dependent circuit lifetime projections - Application to SRAM675
Defect-enhanced Auger recombination and high-carrier-density phenomena in low-temperature grown GaAs676
Defect-enhanced Auger Recombination And High-carrierdensity Phenomena In Low-temperature-grown Gaas678
Defect-enhanced visible electroluminescence of multi-energy silicon-implanted silicon dioxide film679
Defect-Free Epitaxial Lateral Overgrowth (ELO) Technique For Future Generation Low Power CMOSFETs686
Defect-free silicon film on SiO2 formed by zone melting recrystallization with high scanning speed714
Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for Core-Based Digital SoCs739
Defect-oriented Verilog fault simulation of SoC macros using a stratified fault sampling technique794
Defects in Organic Molecular Crystals: Spectroscopy and Effects on Electronic and Optical Properties801
Defects in surface layers of lapped crystal plates and their influence on Q-factors of crystal units804
Defects in the interfacial layer of SiO807
Defects influenced by the Jahn-Teller effect as the sources of flicker noise in GaAs based devices827
Defects rotor identification by magnetic spectrum analyzing in a squirrel-cage asynchronous machine